Product Description:
The N7781C is a compact high-speed polarization analyzer that provides comprehensive capabilities for analyzing the polarization characteristics of optical signals. This includes a representation of the polarization state (SOP) on the Poincare sphere (Stokes parameter). The onboard algorithm, together with the onboard calibration data, ensures high-precision operation over a wide wavelength range.
Due to its real-time measurement capability of 1 M sample/second, the instrument is well suited for analyzing interference and fluctuating signals, as well as control applications that require real-time feedback of polarization information, such as in digital control loops in automated manufacturing test systems.
The built-in user interface allows for a comprehensive analysis of the obtained measurement data and replaces the Polarization Navigator software required by the N7781C's predecessor, the N7781B. Programming uses the new SCPI command set and addresses the instrument to a VISA resource. The instrument is compact, just 1 rack unit high, with LAN and USB interfaces.
Features:
High-speed operation up to 1M samples/s
1240 nm to 1650 nm operating wavelength range
Typical 1.5° polarization state (SOP) measurement uncertainty
Robust, non-moving optics
