Product Description:
The SPA-100 is a convenient optical frequency domain reflectometer (OFDR) add-on module for Santec's tunable laser. When paired together, the entire system can analyze the most compact and complex optical components, producing results for reflectivity, transmission, propagation loss, and event distance.
The whole system adopts OFDR (optical frequency domain reflection measurement) technology, which enables it to analyze the back reflection and transmission characteristics of optical fiber devices/components in spatial domain. The system produces traces similar to OTDR (optical time domain reflectometer), but with higher resolution and accuracy. The sampling resolution of the system is 5 um, allowing it to easily identify structures within PIC (photonic integrated circuits) and silicon photonic (SiPh) devices.
With a wide selection of tunable lasers, OFDR systems are highly configurable and can operate in spectral ranges that are important to the device under test. The system is available in O-band configurations (1260 to 1350 nm range) as well as CL band configurations (1480 to 1640 nm range). There is no need to limit it to a small wavelength range.
Product Features:
Industry's highest resolution reflectometer (<5 μm)
Measure the insertion loss and return loss of optical components
Proximity sensing for in silico photon alignment and testing
Integration with Santec TSL-570 (and TSL-550/TSL-710/ TSL-770)
Feedthrough port for integrated OPM for active alignment of silicon photonic devices
Polarization-maintaining fiber for silicon photonic applications
Includes simple analysis software
Wide scan range (up to 160 nm) for WDL measurements
O-band and CL band configurations are available.
Wide dynamic range (>70 dB) for WDL measurements without gain switching
