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求购奥林巴斯 DSX1000 超景深显微镜

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紧急求购,资金齐备,坐等发货

产品参数

选件 保修时间 状态 是否计量
不保修 完好
成色 发货周期 所在地 数量
8成新 -- 深圳市 1
预算价格: 电议
更新日期:2024-10-09
联系电话:0755-86016691

*产品描述

产品描述:

 DSX1000 工业数码显微镜,有助于在 20-7000 倍放大倍率范围内进行材料分析和高精度测量。DSX 系列数码显微镜将奥林巴斯著名的光学元件的质量与数字技术的易用性完美结合。
 
为了精确观察各种形状和大小的特征,DSX1000 有 15 个物镜可供选择,提供各种放大倍率、分辨率和工作距离。DSX 的放大倍率范围为 20 倍至 7000 倍,在冶金等应用中非常有用,可有效检测宏观和微观结构。长工作距离物镜可以观察不规则的 3D 样品,例如电子板和机加工部件。
 
样品台和载物台都可以在两个方向上旋转 90°,从而更容易从各个方向快速观察和分析样品,而无需移动它们。这有利于检测薄样品(如晶圆)以及大型部件(如汽车零部件)。
 
为了确保一台显微镜适用于尽可能广泛的检查范围,DSX1000 可以使用六种观察模式(明场、暗场、MIX、偏振、倾斜和微分干涉对比)对样品进行成像。模式之间的即时切换意味着可以在一次检测中有效地分析需要不同模式的特征。例如,晶圆检测需要不同的模式来观察晶圆表面的碎屑、划痕和较大的不规则性,这意味着在一台仪器上快速切换可以缩短检测时间。
 
特点:
  • 易于更换的大量镜头选择
  • 按下按钮即可在 6 种不同的观察方法之间切换
  • 快速从宏到微观查看
  • 使用远心光学系统进行精确测量

 

其他要求

Product Description:
 
The DSX1000 industrial digital microscope facilitates material analysis and high-precision measurements in the magnification range of 20-7000 times. The DSX series of digital microscopes combines the quality of Olympus's renowned optical components with the ease of digital technology.
 
For accurate observation of features of all shapes and sizes, the DSX1000 has 15 objective lenses to choose from, offering a variety of magnifications, resolutions and operating distances. With magnifications ranging from 20x to 7000x, DSX is very useful in applications such as metallurgy for the efficient detection of macro and micro structures. Long working distance objectives allow viewing of irregular 3D samples, such as electronic plates and machined parts.
 
Both the sample stage and the stage can be rotated 90° in both directions, making it easier to quickly observe and analyze samples from all directions without moving them. This facilitates the detection of thin samples, such as wafers, as well as large components, such as automotive parts.
 
To ensure that a microscope is suitable for the widest possible range of examination, the DSX1000 can image samples using six viewing modes (bright field, dark field, MIX, polarization, tilt, and differential interference contrast). The instant switching between modes means that features requiring different modes can be efficiently analyzed in a single detection. Wafer inspection, for example, requires different modes to observe chips, scratches, and large irregularities on the wafer surface, which means that switching quickly on one instrument can reduce inspection time.
 
Features:
 
  • Large selection of easily interchangeable lenses
  • Switch between 6 different viewing methods at the press of a button
  • Quick macro to micro view
  • Precise measurements using a telecentric optical system

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