Product Description:
Olympus' MX63 and MX63L microscopes enable precise inspection of electronic devices, making the inspection of large industrial samples fast and simple, even for hard-to-detect samples such as semiconductors, printed circuit boards and flat panel displays.
Large samples such as semiconductors, printed circuit boards and flat panel displays (FPD) can be difficult to detect, but the new Olympus MX63 and MX63L microscopes give users the power, flexibility and ease of use to quickly and easily inspect large industrial samples. Designed for precision inspection of electronic devices, users can choose from MX63 microscopes for up to 200 mm wafers, or MX63L for up to 300 mm wafers.
The modular design of the microscope enables inspectors to select the components needed for their application. Both microscopes are designed for clean rooms and comply with SEMI S2/S8, CE and UL standards. All electric components are installed in a shielded structure, and the frame, pipes, respirators and other components are treated with anti-static electricity.
Features:
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Functionality: Additional features designed to meet the ergonomic and safety requirements of the electronics industry to enhance analytical capabilities
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User-friendly: Simple microscope Settings make it easy for users to adjust and re-invoke system configurations.
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Imaging technology: Our proven and reliable optics and imaging technology provide clear images and reliable inspection.
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Modularity: Users can customize the system by selecting the module suitable for their application.
