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销售VIAVI mOSW-C111C004B0-M100-MFA MAP 光开关模块

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产品参数

选件 是否计量 发货周期 保修时间 成色
(1X4) 3天 12月 8成新
所在地 机身号 状态 资料下载
深圳市 完好
更新日期:2022-12-02
联系电话:0755-86016691

* 产品描述

产品描述:
制造测试自动化对于降低产品成本至关重要,而光开关是任何自动化测试系统的核心。VIAVI mOSW-C1 光开关模块解决方案和 mISW 光开关盒基于行业领先的第四代仪器类 VIAVI 光开关技术构建。mOSW-C1/mISW-C1 在跨网络光切换、监控和制造应用中保持领先地位超过 30 年,它拥有出色的性能和可靠性,并且具有业界最小的体积,树立了一座新的里程碑。


大型固定格式 19 英寸 VIAVI 机架安装系统中才有的性能和重复性首次在一个模块化插件或开关盒中得以实现。制造工程师再也不用在选择测试系统尺寸和系统性能时左右为难。利用 mOSW-C1/mISW-C1 可将切换系统的尺寸缩小多达 75%,同时性能达到了尺寸大很多的传统系统的水平。开关速度提升了 50%,显著节省了连接密集型架构的测试时间。


这些开关是 MAP-200 系列的模块化插卡。它拥有行业中范围最广泛的光学模块,是所有光学行业细分市场中制造测试自动化的最热门选择。这包括无源元件、收发器和线路板卡的制造。由于 MAP-200 可通过远程 VNC、以太网、GPIB 或本地 GUI 进行高级连接,显著简化远程制造站点的调试工作,因此成为复杂自动化架构的一个自然选择。


特点:

  • 可提供所有光切换(与数据速率和传输格式无关)
  • 不管开关大小如何,对系统动态测量范围的影响都能达到最小,对于从 1x2 到 1x176 的所有配置损耗都很低
  • 灵活的 SCPI 远程接口使用户能够使用 MAP-200 样式的命令对开关进行编程,或保持与行业标准 VIAVI SB/SC 系列光开关的向后兼容
  • 保证超低的 0.04 dB PDL 和 ±0.005 dB 重复性,在单输入版本上可以最大程度地降低测量不确定性
  • 新的 PTRIM 选项简化了故障排查,并且可以在已连接的端口上测量最高 20 dB 内联功率的可编程粗损耗
  • 1C、2D(双工)和 2E 输入配置实现了节省成本的架构,可减少所需的开关数
  • 扩张光束技术确保了多模开关是“形式上透明的”,并且不会干扰模式分布,从而大大简化了传输测试或带有符合 IEC 标准模式启动的测试


应用:

  • 多端口组件、模块和线路板卡的测试系统自动化
  • 管理制造中的复杂测试顺序
  • 与 MAP-200 mORL-A1 模块搭配使用来测试多纤芯连接器
  • 长期可靠性测试

详细信息

Product Description:
Manufacturing test automation is critical to reducing product cost, and optical switches are at the heart of any automated test system. The VIAVI mOSW-C1 optical switch module solution and mISW optical switch box are built on industry-leading fourth-generation instrument-class VIAVI optical switch technology. mOSW-C1/mISW-C1 has been a leader in cross-network optical switching, monitoring and manufacturing applications for more than 30 years, setting a new milestone with outstanding performance and reliability and the industry's smallest size.


For the first time, the performance and repeatability found in large fixed-format 19-inch VIAVI rack-mount systems can be achieved in a modular plug-in or switch box. Manufacturing engineers no longer have to choose between test system size and system performance. Using mOSW-C1/mISW-C1 can reduce the size of switching systems by up to 75% while achieving the performance of much larger conventional systems. Switching speed was increased by 50%, significantly saving testing time for connection-intensive architectures.


These switches are MAP-200 series modular cards. It has the widest range of optical modules in the industry and is the most popular choice for manufacturing test automation in all optical industry segments. This includes the manufacture of passive components, transceivers and circuit boards. The MAP-200 is a natural choice for complex automation architectures because it significantly simplifies debugging of remote manufacturing sites by enabling advanced connectivity via remote VNC, Ethernet, GPIB, or a native GUI.


Features:

  • All optical switches are available (independent of data rate and transmission format)
  • Regardless of the switch size, the impact on the system's dynamic measurement range is minimized, with low losses for all configurations from 1x2 to 1x176
  • The flexible SCPI remote interface enables users to program switches using MAP-200 style commands or maintain backward compatibility with the industry standard VIAVI SB/SC family of optical switches
  • Ensures ultra-low 0.04dB PDL and ± 0.005dB repeatability, minimizes measurement uncertainty on single-input versions
  • The new PTRIM option simplifies troubleshooting and can measure programmable rough losses of up to 20 dB of inline power on connected ports
  • The 1C, 2D (duplex), and 2E input configurations implement a cost-saving architecture that reduces the number of switches required
  • The expanded beam technology ensures that the multimode switch is "formally transparent" and does not interfere with the mode distribution, greatly simplifying transmission tests or tests with IEC standard mode startup


Application:

  • Automation of test systems for multi-port components, modules and circuit boards
  • Manage complex test sequence in manufacturing
  • Used in conjunction with the MAP-200 mORL-A1 module to test multi-core connectors
  • Long term reliability test

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