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销售思仪 6433D,6433F,6433H,6433L 光波元件分析仪

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产品参数

选件 是否计量 发货周期 保修时间 成色
4-8周 12月 全新
所在地 机身号 状态 资料下载
深圳市 完好
更新日期:2022-01-05
联系电话:0755-86016691

* 产品描述

产品综述
6433系列光波元件分析仪包括6433D(10MHz~20GHz)、6433F(10MHz~43.5GHz)、6433H(10MHz~50GHz)、6433L(10MHz~67GHz)。6433系列是面向高速电-光(E/O)器件、光-电(O/E)器件、光-光(O/O)器件特性测试的最新解决方案,调制频率范围覆盖10MHz~67GHz,支持不同频率范围、频率间隔、中频带宽的设置,最小频率分辨率达到1Hz。6433系列采用一体集成的设计方案,通过宽带硬件优化设计,构建网络误差模型,利用核心校准算法,实现了一键式宽带快速扫频测试,主要用于现代高速光传输系统中核心电-光器件(电光调制器、直接调制激光器、光发射组件)、电-光器件(PIN光电探测器、APD光电探测器、光接收组件)、光-光器件(光纤滤波器等光无源器件)的带宽、幅频响应、相频响应、群时延等参数测试。
主要特点
校准方便快捷,向导式操作流程
一体化多功能操作界面
大动态测量范围,测量轨迹噪声小
用户数据自动移除,为在片测试提供扩展使用
单端-平衡光电器件模式测量
多功能化工具箱
内、外部光源波长设定,更宽的通信波长测试范围
校准方便快捷,向导式操作流程
6433系列光波元件分析仪在校准方面具有清晰的操作流程,主要包括电校准和光路参数校准,通过采用向导式操作提示为用户提供快速高精度校准。
一体化多功能操作界面
6433系列光波元件分析仪具备了电-电、电-光、光-电、光-光四种测量模式,功能模式之间可任意切换,满足了目前绝大多数通用器件的S参数、阻抗、时域等参数测量需求。
大动态测量范围,测量轨迹噪声小
采用了高精度和响应平坦的内部核心器件,结合通过设定不同中频带宽和平均,可获得更大的动态测量范围和更小的轨迹噪声,可以获取测量结果的更多细节。
用户数据自动移除,为在片测试提供扩展使用
通过用户自定数据或夹具去嵌入数据提升测量精度,尤其在片测试时所需的探针误差移除时,使得测量更加灵活,满足用户不同场合的测量需求。
单端-平衡光电器件模式测量
仪器可通过选用不同的配置,满足单端-单端和单端-平衡的光发射或光接收器件或组件对差分增益和共模抑制参数的测试需求,更加贴合现有和未来高速光纤通信领域中多端口参数的测量场合。
多功能化工具箱
内置大动态范围光功率计,可实时监测输入光功率数值,通过高级设置,可将光发射模块设定为保偏激光源输出模式(CW)模式,消光比大于20dB,为M-Z型LiNiO3调制器提供所需的保偏光源。
内、外部光源波长设定,更宽的通信波长测试范围
测试不仅局限于1310nm/1550nm,支持1260nm~1630nm的外部光源输入,覆盖更宽的通信波长,满足CWDM、DWDM系统核心器件测量需求。
大动态测量范围,测量轨迹噪声小
采用了高精度和响应平坦的内部核心器件,结合通过设定不同中频带宽和平均,可获得更大的动态测量范围和更小的轨迹噪声,可以获取测量结果的更多细节。




详细信息

Product Overview
The 6433 series of light wave component analyzers include 6433D (10MHz~20GHz), 6433F (10MHz~43.5GHz), 6433H (10MHz~50GHz), 6433L (10MHz~67GHz). The 6433 series is the latest solution for characteristic testing of high-speed electro-optical (E/O) devices, optical-electric (O/E) devices, and optical-optical (O/O) devices. The modulation frequency range covers 10MHz~67GHz and supports With different frequency ranges, frequency intervals, and intermediate frequency bandwidth settings, the minimum frequency resolution can reach 1 Hz. The 6433 series adopts an integrated design scheme. Through broadband hardware optimization design, the network error model is constructed, and the core calibration algorithm is used to realize a one-click broadband fast frequency sweep test. It is mainly used for core electro-optical devices in modern high-speed optical transmission systems. (Electro-optical modulator, directly modulated laser, optical transmitting component), electro-optical device (PIN photodetector, APD photodetector, optical receiving component), optical-optical device (optical passive components such as fiber filter) , Amplitude-frequency response, phase-frequency response, group delay and other parameter tests.
main feature
Convenient and quick calibration, guided operation process
Integrated multi-function operation interface
Large dynamic measurement range, low measurement track noise
User data is automatically removed, providing extended use for on-chip testing
Single-ended-balanced photoelectric device mode measurement
Multifunctional toolbox
Internal and external light source wavelength setting, wider communication wavelength test range
Convenient and quick calibration, guided operation process
The 6433 series of light wave component analyzers have a clear operation process in calibration, which mainly includes electrical calibration and optical path parameter calibration, and provides users with fast and high-precision calibration through the use of wizard-style operation prompts.
Integrated multi-function operation interface
The 6433 series of light wave component analyzers have four measurement modes: electricity-electricity, electricity-light, light-electricity, and light-light. The function modes can be switched at will, which meets the S parameters, impedance, and impedance of most common devices at present. Parameter measurement requirements such as time domain.
Large dynamic measurement range, low measurement track noise
Using high-precision and flat-response internal core components, combined with setting different IF bandwidths and averages, a larger dynamic measurement range and smaller trace noise can be obtained, and more details of the measurement results can be obtained.
User data is automatically removed, providing extended use for on-chip testing
The measurement accuracy is improved by user-defined data or fixture de-embedding data, especially when the probe error required for chip testing is removed, making the measurement more flexible and meeting the user's measurement needs in different occasions.
Single-ended-balanced photoelectric device mode measurement
The instrument can choose different configurations to meet the test requirements of single-ended-single-ended and single-ended-balanced optical transmitting or optical receiving devices or components for differential gain and common mode rejection parameters, which is more suitable for existing and future high-speed optical fiber communications Multi-port parameter measurement occasions in the field.
Multifunctional toolbox
Built-in large dynamic range optical power meter, which can monitor the input optical power value in real time. Through advanced settings, the optical transmitter module can be set to the polarization-maintaining laser source output mode (CW) mode, the extinction ratio is greater than 20dB, and it is provided for the MZ-type LiNiO3 modulator The required polarization maintaining light source.
Internal and external light source wavelength setting, wider communication wavelength test range
The test is not limited to 1310nm/1550nm, supports external light source input from 1260nm to 1630nm, covers a wider communication wavelength, and meets the measurement requirements of the core components of CWDM and DWDM systems.
Large dynamic measurement range, low measurement track noise
Using high-precision and flat-response internal core components, combined with setting different IF bandwidths and averages, a larger dynamic measurement range and smaller trace noise can be obtained, and more details of the measurement results can be obtained.

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