模块和托盘版本;760 至 1650 纳米;插入损耗 0.7 至 1.2 dB;回波损耗 25 至 62 dB;最大限度。串扰 -55, -60, -80 dB; 最大限度。输入功率 300 毫瓦
制造测试自动化对于降低产品成本至关重要,而光开关是任何自动化测试系统的核心。Viavi Solutions 的 mOSW-C1 MAP 系列光开关模块和 mISW-C1 MAP 系列光开关托盘基于行业领先的第四代仪器类 Viavi Solutions 光开关技术。mOSW-C1/mISW-C1 MAP 系列在跨网络、监控和制造应用的光交换领域拥有 30 多年的领先地位,以业界最小的占地面积代表着性能和可靠性的新里程碑。
首次在模块化插件或托盘中提供大型固定格式 19 英寸 Viavi Solutions 机架安装系统的性能和可重复性。制造工程师不再需要在测试系统的尺寸和性能之间做出选择。利用 mOSW-C1/mISW-C1 MAP 系列可以将交换系统的尺寸减少多达 75%,同时仍然提供更大的传统系统的性能。开关速度提高 50% 显着节省了连接密集型架构的测试时间。
这些交换机是 MAP-300(和传统 MAP-200)系列的组件。凭借业内最广泛的光学模块,它是所有光学行业细分市场中制造测试自动化最受欢迎的选择。这包括无源元件、转发器和线卡的制造。通过远程 VNC、以太网、GPIB 或本地 GUI 的高级连接使 MAP-300成为复杂自动化架构的自然选择,因为它极大地简化了远程制造站点的调试。
主要特征:
应用:多端口组件、模块和线卡的测试系统自动化;制造中复杂测试序列的管理;多光纤连接器测试(与 mORL-A1 配对);长期可靠性测试
Module & Tray Versions; 760 to 1650 nm; Insertion Loss 0.7 to 1.2 dB; Return Loss 25 to 62 dB; max. Crosstalk -55, -60, -80 dB; Max. Input Power 300 mW
Manufacturing test automation is critical to reducing product costs and optical switches are at the heart of any automated test system. Viavi Solutions’ mOSW-C1 MAP series of optical switch modules and mISW-C1 MAP series of optical switch trays are built on the industry-leading, fourth-generation instrumentation class of Viavi Solutions optical switch technology. With more than 30 years of leadership in optical switching across network, monitoring, and manufacturing applications, the mOSW-C1/mISW-C1 MAP series represents a new milestone for performance and reliability with the industry’s smallest footprint.
For the first time, the performance and repeatability found in large, fixed format 19-inch Viavi Solutions rack-mount systems are available in a modular plug-in or tray. Manufacturing engineers no longer have to choose between test system’s size and its performance. Leveraging the mOSW-C1/mISW-C1 MAP series can reduce the size of switching systems by as much as 75% while still delivering the performance of much larger legacy systems. A 50% increase in switching speeds significantly saves testing time for connection-intensive architectures.
These switches are components of the MAP-300 (and legacy MAP-200) family. With the widest range of optical modules in the industry, it is the most popular choice for manufacturing test automation across all optical industry segments. This includes the manufacture of passive components, transponders, and line cards. Advanced connectivity through remote VNC, Ethernet, GPIB, or local GUI makes the MAP-300 a natural choice for complex automation architectures because it dramatically simplifies debugging for remotely located manufacturing sites.
Key Features:
Applications: Test System Automation for Multi-port Components, Modules and Line Cards; Management of Complex Test Sequencing in Manufacturing; Test of Multi-fiber Connectors (Paired With mORL-A1); Test for Long-term Reliability
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