Keysight 4291B射频阻抗/材料分析仪是针对表面封装元器件和介电/磁性材料的高精度测量的完整解决方案。与反射测量技术不同，Keysight 4291B使用直接的电流－电压测量技术，可在广泛的阻抗范围内提供更精确的阻抗测量结果。
基本阻抗精度是+/- 0.8%。高Q精度有利于进行低损耗元器件分析。内置合成器扫频范围从1 MHz到1.8 GHz，具有1 MHz的分辨率。1.8米长的精密电缆可将分析仪连接到测试站，以便您将测试点延伸到分析仪之外，而不会影响测量精度。先进的矩阵和错误补偿功能消除了夹具的测量错误，确保DUT/MUT的高精度和可重复性。
Keysight 4291B还提供自动电平精度控制和用IBASIC程序功能监视测试信号；可在恒压或恒流下测量器件。用可选的直流偏置(达40V和100mA)使测量偏置独立于阻抗特性。只要按一个按钮，内装的等效电路分析功能就自动计算5种电路模型的电路常数值。
Keysight 4291B有2个测量通道；每一个通道都可设置为测量1个(即Z)或2个(即Z-theta)阻抗参数。具有分割显示的彩色TFT可显示有效示踪和存储器示踪(保存在RAM中)。内部软盘驱动器以LIF或MS-DOS格式保存程序和测试数据。有了内装IBASIC，您就能从Keysight 4291B直接控制恒温箱或园片探测器这类外部测试设备，而不需要单独的仪器控制器。
材料评估
Keysight 4291B能容易地进行全面的材料评估，提高材料评估的质量和效率。Keysight 4291B提供宽频率范围(1MHz至1GHz)介电/磁性材料测量的总体解决方案。
The Keysight 4291B RF impedance/material analyzer provides a total solution for high-accuracy and easy measurement of surface-mount components and dielectric/magnetic materials. The Keysight 4291B uses a direct current-voltage measurement technique, opposing the reflection measurement technique, for more accurate impedance measurement over wide impedance range.
Basic impedance accuracy is +/- 0.8%. High Q accuracy enables low-loss component analysis. An internal synthesizer sweeps frequency from 1 MHz to 1.8 GHz with 1 mHz resolution. A 1.8-m error-less cable connects the analyzer to a test station so you can extend your test point away from the analyzer without losing accuracy. Advanced calibration and error compensation function eliminate measurement error factors in fixtures and assure high accuracy and repeatability at DUT/MUT.
The Keysight 4291B also provides automatic level control and monitor of test signals by using IBASIC programming function; devices can be measured under a constant voltage or current. Measure bias dependent impedance characteristics with optional dc bias (up to 40 V and 100 mA). At the push of a button, the built-in Equivalent Circuit Analysis Function automatically calculates the circuit constant values of five circuit models.
The Keysight 4291B has two measurement channels; each channel can be set to measure a single (e.g. Z) or dual (e.g. Z-theta) impedance parameter. The color TFT with split-display can show both active traces and memory traces (stored in RAM). A built-in floppy disk drive stores programs and test data in either LIF or MS-DOS format. With built-in IBASIC, you can control external test equipment such as a temperature chamber or wafer prober directly from the Keysight 4291B. You do not need a separate instrument controller.
Material Evaluation
The Keysight 4291B enables easy and sophisticated material evaluation and improves material evaluation quality and efficiency. The Keysight 4291B provides the total dielectric/magnetic material measurement solutions in wide frequency range (1 MHz to 1 GHz).
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