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租赁安藤 AQ6140 光波长计

浏览次数:1091

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产品参数

选件 状态 设备价值 是否计量
完好 0
成色 发货周期 所在地
8成新 -- 深圳市
租赁价格: 电议
更新日期:2024-03-28
联系电话:0755-86016691

*产品描述

附加的功能:

  • D-WDM系统中波长分析的理想选择
  • 高精度波长测量: 实现±0.003 nm的高精度测量。(在1310 nm,1550 nm)
  • 高可分辨分离度:最小可分离分离度:10 GHz或更小(1550 nm:80 pm)
  • 最多可以测量256个通道:最多可以测量256个通道的 波长和功率
  • 操作简单:三步(最大)操作使您免于复杂操作
  • 峰列表放大显示:可以在通常显示5通道数据的区域显示一个通道的放大数据
  • 漂移测量:是指测量随时间变化的波长和功率。(最多256个通道)
  • 栅格监视功能:用于检查每个栅格的波长偏移的有用功能
  • 监视WDM光源的完整功能:用于光源稳定性分析的完整功能,例如可变速率的3D显示,时间位移显示,可变速率陷波功能等。
  • 完整的存储功能:可以将测量数据和测量条件记录在软盘和内部存储器中
  • 大型(6.5英寸)彩色显示屏:通过同时显示波形和测量数据,可以一次检查波形数据和峰值波长

规格:

  • 适用光纤:SM
  • 波长范围:1270至1650 nm(182至236 THz)
  • 波长精度:±2 ppm(1550 nm,1310 nm:±0.003 nm)
  • 最小可分辨间隔:10 GHz或更小(1550 nm:80 pm,等功率线输入)
  • 功率精度:±0.5 dB(1310/1550±30 nm,典型值)
  • 电平线性度:1270至1600 nm:±0.3 dB(输入:-30 dBm或更高)
  • 取决于损耗的极化:1270至1600 nm:±0.5 dB; 1600至1650 nm:1.0 dB
  • 最大线路输入数:256
  • 最小输入电平:1270至1600 nm:-40 dBm(1行输入); 1600至1650 nm:-30 dBm(1行输入)
  • 最大输入电平:+10 dBm(所有线路的总和)
  • 安全最大值 输入电平:+18 dBm(所有线路的总和)
  • 回波损耗:35 dB(PC)
  • 信噪比:35 dB(典型值)(噪声带宽:0.1 nm,输入:-25 dBm或更高,间隔≥100 GHz)
  • 测量时间:≤1.5秒
  • 显示:6.5英寸彩色LCD(640 x 480点)
  • 内存:内部:可存储10个测量结果和条件
  • 软盘(3.5英寸2HD):可以存储测量结果和条件
  • 内置硬盘驱动器:9MB:可以存储测量结果和条件
  • 接口:GP-IB:GP-IB(IEEE.488.2); RS-232C:9针D-sub
  • 打印机端口:25针D-sub(Centronics)
  • VGA显示器:15针D-sub
  • 光纤连接器:AQ9441(FC)通用适配器
  • 电源要求:AC 100至120/200至240 V,50/60 Hz(47至63 Hz),100 VA
  • 环境条件:工作温度:5至40°C,存储温度:-20至+60°C,湿度:80%RH或更低(在40°C,无冷凝)
  • 尺寸:约 425(宽)x 132.5(高)x 450(深)毫米

应用领域

WDM光源的特性评估

最多可测量256个通道的波长和功率,并一次显示波形和测量结果。能够检查它是否与ITU-T的建议相匹配以及对电网进行严格监控。还能够显示峰值波长和功率列表。

长期功能

显示一个通道的峰值波长和功率的变化。在波形下方,不仅显示当前测量结果,还显示最大速率,最小速率或最大速率和最小速率的平衡。

电网监控功能

分析设置栅格的峰值波长。搜索峰值波长,或分析网格中的波长间隔和功率变化。

标准画面

波形和峰值同时显示在标准屏幕上。它用于监视WDM系统温度特性并评估激光振荡器。

3D显示屏

一次显示3D波形和峰列表。它有助于按时间检查测量结果的变化。

清单画面

此模式显示峰值波长列表,一次最多显示14个。

标记画面

标记功能简化了诸如波长和功率水平差异分析之类的任务。

标签输入画面

标签最多可以输入36个字符,因此文件管理变得容易。

文件画面

测量的波形数据可以以多种文件格式保存。文件调用功能使在与存储数据相同的测量条件下进行新测量成为可能,这是WDM系统维护的理想选择。

近年来,用于大容量光通信的波分复用(WDM)传输技术的实际应用导致了当前的情况,即我们即将生产50 GHz波长的系统。

因此,对更高规格的波长参数测试仪的需求正在增加。这种测试仪可以大大改善传输系统和光学设备的评估。

Ando AQ6140多波长测量仪提供了出色的波长精度和可分辨的测量间隔,超越了这一需求,使其成为从D-WDM系统开发到制造的所有应用的理想选择。

详细信息

Additional Features:

  • Ideal for Wavelength Analysis in D-WDM Systems
  • Highly accurate wavelength measurement: Realizes high accuracy measurement of ±0.003 nm. (at 1310 nm, 1550 nm)
  • High resolvable separation: Minimum resolvable separation: 10 GHz or less (1550 nm: 80 pm)
  • Capable of measurement for up to 256 channels: Wavelength and power measurement for up to 256 channels
  • Simple operation: Three-step (maximum) operation saves you from complicated operation
  • Enlarge display of peak list: Can display enlarged data of one channel in the area normally displaying data of 5 channels
  • Drift measurement: Refers to measuring the time-passage changes wavelength and power. (up to 256 channels)
  • Grid monitoring function: Useful function for checking wavelength shift of each grid
  • Complete functions for monitoring WDM light source: Complete functions for stability analysis of light source such as 3D display of variable rate, time displacement display, variable rate trap function, etc.
  • Complete memory functions: Can record measurement data and measurement conditions in floppy disk and internal memory
  • Large-size (6.5-inch) color display: Can check waveform data and peak wavelength at a time by displaying waveforms and measurement data simultaneously

Specifications:

  • Applicable fiber: SM
  • Wavelength range: 1270 to 1650 nm (182 to 236 THz)
  • Wavelength accuracy: ±2 ppm (1550 nm, 1310 nm: ±0.003 nm)
  • Minimum resolvable separation: 10 GHz or less (1550 nm: 80 pm, equal power line input)
  • Power accuracy: ±0.5 dB (1310/1550±30 nm, typ.)
  • Level linearity: 1270 to 1600 nm: ±0.3 dB (input: -30 dBm or more)
  • Polarization depending loss: 1270 to 1600 nm: ±0.5 dB; 1600 to 1650 nm: 1.0 dB
  • Maximum number of line input: 256
  • Minimum input level: 1270 to 1600 nm: -40 dBm (1 line input); 1600 to 1650 nm: -30 dBm (1 line input)
  • Maximum input level: +10 dBm (total of all lines)
  • Safe max. input level: +18 dBm (total of all lines)
  • Return loss: 35 dB (PC)
  • SN ratio: 35 dB (typ.) (noise band width: 0.1 nm, input: -25 dBm or more, spacing ≥ 100 GHz)
  • Measurement time: ≤ 1.5 sec
  • Display: 6.5-inch color LCD (640 x 480 dots)
  • Memory: Internal: Can memorize 10 measurement results and conditions
  • Floppy disk (3.5-inch 2HD): Can memorize measurement results and conditions
  • Internal hard disk drive: 9MB: can memorize measurement results and conditions
  • Interfaces: GP-IB: GP-IB (IEEE. 488.2); RS-232C: 9-pin D-sub
  • Printer port: 25-pin D-sub (Centronics)
  • VGA monitor: 15-pin D-sub
  • Optical connector: AQ9441 (FC) Universal Adapter
  • Power requirements: AC 100 to 120/200 to 240 V, 50/60 Hz (47 to 63 Hz), 100 VA
  • Environmental conditions: Operation temperature: 5 to 40 °C, storage temperature: -20 to +60 °C, humidity: 80 % RH or less (at 40 °C, no condensation)
  • Dimensions: Approx. 425 (W) x 132.5 (H) x 450 (D) mm

Applications

Characteristic evaluation of light source for WDM

Measures both wavelength and power up to 256 channels, and displays waveform and measurement result at a time. Capable of checking if it’s matched to advice of ITU-T and severe monitoring of grid. Also capable of displaying the list of peak wavelength and power.

Long-term function

Displays changes of peak wavelength and power of one channel. Below waveforms, displays not only current measurement result but also maximum rate, minimum rate or balance of maximum rate and minimum rate.

Grid monitoring function

Analyzes peak wavelength of set grid. Searches peak wavelength, or analyzes wavelength gap and changes of power within the grid.

Standard screen

The waveform and the peaks are displayed simultaneously on the standard screen. It is used to monitor WDM system temperature characteristics and evaluate laser oscillators.

3D display screen

Displays 3D waveforms and peak lists at a time. It helps to check the change of measurement result by time.

List screen

This mode displays a list of the peak wavelengths, up to 14 at a time.

Marker screen

The marker function simplifies tasks such as analysis of wavelength and power level difference.

Label input screen

Label can be input up to 36 characters, so that file management can be easy.

File screen

Measured waveform data can be saved in a variety of file formats. The file recall function makes it possible to make new measurement with the same measurement conditions as saved data, which is ideal for WDM system maintenance.

Practical application in recent years of Wavelength Division Multiplexing (WDM) transmission technology for high-volume optical communication has led to the current situation in which we’re on the verge of producing 50 GHz-wavelength systems.

Accordingly, demand for a higher-specification wavelength parameter tester is increasing. Such a tester can go a long way toward improving evaluation of transmission systems and optical devices.

The Ando AQ6140 Multi-Wavelength Meter, providing excellent wavelength accuracy and resolvable separation in measurement, surpasses this demand, making it ideal for all applications from D-WDM system development to manufacturing.

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