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| 选件 | 是否计量 | 发货周期 | 保修时间 | 成色 |
|---|---|---|---|---|
| 否 | 10天 | - | 全新 | |
| 所在地 | 机身号 | 状态 | 资料下载 | |
| 深圳市 | 完好 |
Series 2600B current/voltage source and measure instruments are built from Keithley's 3rd generation SMU technology. Each tightly integrated instrument offers the capabilities of a precision power supply, true current source, 6 digit DMM, arbitrary waveform generator, pulse generator and electronic load. Series 2600B models feature built-in Java-based test software which enables true plug & play I/V characterisation through any browser, on any computer, from anywhere in the world. Series 2600B is a family of powerful instruments with unique capabilities in testing components and devices across many applications including R&D, production test, education and QA/FA.
4-quadrant voltage/current source and measure with 6 digit resolution (2-line VFD display)
Choose model from series offering exceptional dynamic range, 10A pulse to 0.1fA and 200V to 100nV
Built-in Java-based test software
Test Script Processing (TSP) technology embeds complete test programs for best-in-class system-level throughput
TSP-Link expansion technology for multi-channel parallel test without a mainframe
USB 2.0, LXI-C, GPIB, RS-232 and digital I/O interfaces
Software drivers and development/debug tools supplied
Model choice includes lower specification (2604B, 2614B, 2634B) instruments
Series 2600B current/voltage source and measure instruments are built from Keithley's 3rd generation SMU technology. Each tightly integrated instrument offers the capabilities of a precision power supply, true current source, 6 digit DMM, arbitrary waveform generator, pulse generator and electronic load. Series 2600B models feature built-in Java-based test software which enables true plug & play I/V characterisation through any browser, on any computer, from anywhere in the world. Series 2600B is a family of powerful instruments with unique capabilities in testing components and devices across many applications including R&D, production test, education and QA/FA.
4-quadrant voltage/current source and measure with 6 digit resolution (2-line VFD display)
Choose model from series offering exceptional dynamic range, 10A pulse to 0.1fA and 200V to 100nV
Built-in Java-based test software
Test Script Processing (TSP) technology embeds complete test programs for best-in-class system-level throughput
TSP-Link expansion technology for multi-channel parallel test without a mainframe
USB 2.0, LXI-C, GPIB, RS-232 and digital I/O interfaces
Software drivers and development/debug tools supplied
Model choice includes lower specification (2604B, 2614B, 2634B) instruments
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