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销售爱德万 Q8341 光谱分析仪

浏览次数:2723

产品参数

选件 是否计量 发货周期 保修时间 成色
1-4天 12月 8成新
所在地 机身号 状态 资料下载
深圳市 完好
价格: 50000元 (13%增值税专用发票)
更新日期:2022-09-23
联系电话:0755-86016691

* 产品描述

产品描述:

Q8341是Advantest的光学分析仪。光谱分析仪,也称为光学分析仪,是一种测量光源功率的精密仪器。该电子测试设备用于监视指定波长范围内的功率分配。它在图形中显示测量值,其中功率是垂直刻度,波长是水平刻度。


附加的功能:

  • 高速,高精度地测量LD
  • 高速测量选项:0.5 s
  • 小型轻巧的平台
  • 相干测量分辨率:0.001 mm
  • 波长分辨率(在650 nm时):0.05 nm(标准),0.01 nm(可选)
  • 测得的峰值波长分辨率为0.001 nm
  • 波长测量精度:±0.05 nm(标准),±0.01 nm(可选)
  • 最高 输入电平:±10 dBm
  • 最高 相干测量长度:约 10 mm(标准),约 40毫米(可选)
  • 波长测量范围:350至1000 nm

技术指标

波长

  • 测量范围:350至1000 nm
  • 精度:标准:±0.05 nm;选项:±0.05 nm(正常分辨率模式);±0.01 nm(高分辨率模式)
  • 分辨率:标准:0.05 nm;选项:0.05 nm(正常分辨率模式);0.01 nm(高分辨率模式)

水平

  • 输入灵敏度:–50 dBm或更低(350至1000 nm);–55 dBm或更低(400至900 nm)
  • 最大输入功率:+10 dBm
  • 精度:±1.0 dB(780nm,输入电平为–10 dBm)
  • 音阶:0.2、0.5、1.0、2.0、5.0、10 dB / div和线性
  • 动态范围:30 dB或更高

连贯性

  • 最高 分析长度
  • 标准:10.3毫米
  • 选件:41.4毫米
  • 测量分辨率:0.001毫米
  • 输入回波损耗:30 dB

测量时间

  • 连续模式:标准:2秒或更短;选项:0.5秒或更短(正常分辨率模式);1.0 s或更短(高分辨率模式)
  • 脉冲模式:2秒或更短

功能

  • 操作/分析:光谱宽度测量,自动峰搜索,峰归一化,平均,总功率,脉冲光测量模式
  • 显示,其他功能:叠加显示,列表显示,光标功能,累计动作时间确认功能
  • 存储器功能:内部CF存储器(50 MB或更多):测量数据(文本),屏幕显示数据(Bmp),可通过USB使用外部存储设备

光学输入

  • 连接器:FC型
  • 适用光纤:50/125 GI光纤

I / O接口:

  • GPIB(IEEE 488.2)
  • 乙太网路(10/100 Base)
  • VGA输出
  • USB端口
  • PS / 2鼠标
  • 显示:6.5英寸彩色LCD(640 x 480点)

一般规格

  • 工作环境:环境温度:+10至+ 40°C
  • 相对湿度:最大85%(无凝结)
  • 储存环境:环境温度:–10至+ 50°C
  • 相对湿度:最大90%(无凝结)
  • 电源:100至120 VAC / 220至240 VAC,50/60 Hz,150 VA或以下
  • 在100和200 V系统之间自动切换
  • 尺寸:约 424(高)x 132(宽)x 500(深)毫米

Advantest Q8341是一款光谱分析仪,用于可见光辐射,波长范围为350 nm至1000 nm。由于Q8341使用带有迈克尔逊干涉仪的傅立叶光谱系统,因此可以测量相干性。Q8341的窄波长分辨率为0.01 nm(可选),不仅对评估CD / DVD激光二极管非常有效,而且对蓝紫色激光二极管也非常有效。此外,内置的氦氖激光器用作波长参考,以确保±0.01nm的高波长测量精度(可选)。最后,Q8341以0.5 s(可选)的快速测量速度,非常适合评估系统组件的温度特性。

测量原理

Q8341使用迈克尔逊干涉仪。在这种布置中,来自被测设备的光被分解并沿两个路径传播(在两个结果光路径之间引入了干涉)。由此产生干涉图。水平轴表示两个光路的长度(即时间或相位)之差。相反,纵轴表示干涉光强度。这是被测设备的自相关。然后对该功能执行FFT即可得出功率谱。为了解决这个问题,氦氖激光器用作波长参考源。

高速测量选项:0.5 s。

制造/生产环境的理想选择

Q8341的全量程约为。0.5秒 此功能使Q8341非常适合激光和发光二极管生产线。此外,这种快速的测量速度非常适合高通量环境。

出色的相干分析长度

  • 分析长度:约 40 mm,最大(可选)
  • 大约 最大10毫米(标准)
  • 最高 长度分辨率:0.001毫米

Q8341还评估光盘的激光二极管的相干性。Q8341具有长达40 mm的长分析长度和0.001 mm的窄分辨率,最适合评估蓝紫色激光二极管和其他紧凑型光学组件。

波长精度高

  • 波长精度:±0.01 nm(可选),±0.05 nm(标准)

借助其内置的Ne-He激光参考光源,Q8341以高波长精度测量光谱。

窄分辨率测量蓝紫色激光二极管的振荡模式

  • 波长分辨率(在650 nm时):0.01 nm(可选),0.05 nm(标准)

Q8341具有较窄的分辨率,可分离蓝紫色激光二极管的振荡模式。此外,所测得的0.001 nm峰值波长的分辨率非常适合监视受DUT周围环境影响的测量结果。

用于高通量测量

Q8341采用大容量存储器和高性能计算单元,可快速存储数据。然后,该数据由设备进行计算以显示指定的波长和跨度。例如,如果Q8341分析两个波长范围(650 nm±50 nm和780 nm±50 nm)的光谱,则仅更改其显示范围就对两个独立的LD进行光谱分析。所有这些都无需重新配置系统即可完成。因此,Q8341减少了批量生产系统使用的索引时间。

测量例

DVD激光二极管的相干测量

DVD激光二极管的一项重要相干特性是确定峰对第二峰的干扰比输出。Q8341只需按一个键即可进行测量。它还将相干性计算显示为结果数据。

自动测量:激光二极管的峰值波长,中心波长和光谱宽度

峰值波长(λp),中心波长(λo)和光谱宽度(Δλ)是激光二极管的基本光谱测量参数。用一个键,Q8341自动计算并在CRT上显示这些结果。

动态范围广

使用选件70,Q8341以较窄的分辨率执行测量。这使您可以为405 nm波段LD分离振荡模式。



详细信息

Additional Features:

  • Measures LDs with high speed and high accuracy
  • High speed measurement option: 0.5 s
  • Small, lightweight platform
  • Coherence measurement resolution: 0.001 mm
  • Wavelength resolution (at 650 nm): 0.05 nm (standard), 0.01 nm (option)
  • The measured resolution of the peak wavelength is 0.001 nm
  • Wavelength measurement accuracy: ±0.05 nm (standard), ±0.01 nm (option)
  • Max. input level: ±10 dBm
  • Max. Coherence measurement length: Approx. 10 mm (standard), Approx. 40 mm (option)
  • Wavelength measurement range: 350 to 1000 nm

Specifications

Wavelength

  • Measurement range: 350 to 1000 nm
  • Accuracy: Standard: ±0.05 nm; Option: ±0.05 nm (Normal Resolution Mode); ±0.01 nm (High Resolution Mode)
  • Resolution: Standard: 0.05 nm; Option: 0.05 nm (Normal Resolution Mode); 0.01 nm (High Resolution Mode)

Level

  • Input sensitivity: –50 dBm or less (350 to 1000 nm); –55 dBm or less (400 to 900 nm)
  • Maximum input power: +10 dBm
  • Accuracy: ±1.0 dB (780nm, Input level of –10 dBm)
  • Scale: 0.2, 0.5, 1.0, 2.0, 5.0, 10 dB/div and Linear
  • Dynamic range: 30 dB or more

Coherence

  • Max. analysis length
  • Standard: 10.3 mm
  • Option: 41.4 mm
  • Measurement resolution: 0.001 mm
  • Input return loss: 30 dB

Measurement time

  • CW Mode: Standard: 2 s or less; Option: 0.5 s or less (Normal Resolution Mode); 1.0 s or less (High Resolution Mode)
  • Pulse Mode: 2 s or less

Functions

  • Operation/analysis: Spectral width measurement, Automatic peak search, Peak normalization, Averaging, Total Power, Pulse light measurement mode
  • Display, Other functions: Superimpose display, List display, Cursor function, Accumulating operation time verify function
  • Memory function: Internal CF memory (50 MB or more): Measurement data (Text), Screen Display data (Bmp), An external storage device is available via USB

Optical input

  • Connector: FC type
  • Applicable fiber: 50/125 GI fiber

I/O interface:

  • GPIB (IEEE 488.2)
  • Ethernet (10/100 Base)
  • VGA output
  • USB port
  • PS/2 Mouse
  • Display: 6.5-inch color LCD (640 x 480 dots)

General Specifications

  • Operating environment: Ambient temperature: +10 to +40°C
  • Relative humidity: 85% max. (no condensation)
  • Storage environment: Ambient temperature: –10 to +50°C
  • Relative humidity: 90% max. (no condensation)
  • Power supply: 100 to 120 VAC/220 to 240 VAC, 50/60 Hz, 150 VA or less
  • Automatic switching between 100 and 200 V systems
  • Dimensions: Approx. 424 (H) x 132 (W) x 500 (D) mm

The Advantest Q8341 is an optical spectrum analyzer for visible radiation with a wavelength range of 350 nm to 1000 nm. Because it uses a Fourier spectrum system with a Michelson interferometer, the Q8341 can measure coherence. With its narrow wavelength resolution of 0.01 nm (with option), the Q8341 is very effective for the evaluation of not only CD/DVD laser diodes, but also for blue-violet laser diodes. In addition, the built-in He-Ne laser acts as a wavelength reference to ensure a high wavelength measurement accuracy of ±0.01nm (with option). Finally, with its fast 0.5 s (with option) measurement speed, the Q8341 is ideal for evaluating temperature characteristics of system components.

Measurement principle

The Q8341 uses a Michelson interferometer. In this arrangement, the light from the device-under-test is split and travels down two paths (with interference introduced between the two resulting light paths). From this, an interferogram is created. The horizontal axis represents the difference in length (i.e., time or phase) of the two light paths. In contrast, the vertical axis represents the interference light intensity. This is the autocorrelation of the device-under-test. Performing an FFT on this function then yields the power spectrum. To help with this, a He-Ne laser is used as the wavelength reference source.

High-speed measurement option: 0.5 s.

Ideal for manufacturing/production environments

The Q8341 measures a full span in approx. 0.5 seconds. This feature makes the Q8341 ideal for laser and light-emitting diode production lines. In addition, this fast measurement speed is ideal for high throughput environments.

Excellent coherence analysis length

  • Analysis length: Approx. 40 mm, MAX (option)
  • Approx. 10 mm, MAX (standard)
  • Max. length resolution: 0.001 mm

The Q8341 also evaluates the laser diode's coherence for optical discs. With a long analysis length of up to 40 mm and a narrow resolution of 0.001 mm, the Q8341 is best suited to evaluate blue-violet laser diodes and other compact optical components.

High wavelength accuracy

  • Wavelength accuracy: ±0.01 nm (option), ±0.05 nm (standard)

With its built-in Ne-He laser reference light source, the Q8341 measures spectrum with high wavelength accuracy.

Narrow-resolution to measure the oscillation mode of blue-violet laser diodes

  • Wavelength resolution (at 650 nm): 0.01 nm (option), 0.05 nm (standard)

With its narrow resolution, the Q8341 separates the oscillation mode of blue-violet laser diodes. In addition, the measured resolution of the peak wavelength of 0.001 nm is ideal for monitoring measurement result affected by the ambient environment of the DUT.

For high-throughput measurement

Employing the large-capacity memory and high-performance calculation unit, the Q8341 quickly stores data. This data is then calculated by the unit to reveal the specified wavelength and span. For example, if the Q8341 analyzes the spectrums of two wavelength ranges (650 nm ±50 nm and 780 nm ±50 nm), it executes the spectrum analysis of the 2 separate LDs by changing only its display range. All of this is done without reconfiguring the system. Hence, the Q8341 reduces the index time for mass production system use.

Measurement Examples

Coherent measurement of DVD laser diode

One important coherence characteristic of DVD laser diodes is determining the interference ratio output of the peak to the 2nd peak. The Q8341 measures this by simply pressing a key. It also displays the coherence calculations as result data.

Automatic measurements: Peak wavelength, center wavelength and spectral width of laser diodes

The peak wavelength (λp), center wavelength (λo) and spectral width (Δλ) are fundamental spectrum measurement parameters for laser diodes. With one key, the Q8341 automatically calculates and displays these results on the CRT.

Wide dynamic range

With option 70, the Q8341 performs measurements with narrow resolution. This enables you to separate oscillation modes for 405 nm band LDs.

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