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销售安立 MP1800A+MU181000A+MU181020A*2+MU181040A+MU181800A+MU181000A 信号质量分析仪+模块

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产品参数

选件 是否计量 发货周期 保修时间 成色
MU181000A+MU181020A*2+MU181040A+MU181800A+MU181000A 1-4周 12天 8成新
所在地 机身号 状态 资料下载
深圳市 完好
价格: 250000元 (13%增值税专用发票)
更新日期:2021-05-25
联系电话:0755-86016691

* 产品描述

主要特征:

  • 误码率测试范围 0.1 Gbit/s 至 32.1 Gbit/s
  • 外接 MUX/DEMUX 时误码率测试范围上限可达 64.2 Gbit/s
  • 高质量 (12 ps 升/降时间) 和低抖动 (8 ps p-p) PPG 波形,最高 3.5 Vp-p
  • 超高灵敏度误码分析仪 (典型值 10 mV)
  • 外接 MP1825B 时 32.1 Gbit/s 四阶加重
  • 同步并行误码率和串扰检测,最多 32 个信道
  • 抖动容限测试最高 32.1 Gbit/s
    • SJ 最高 2000 UI。高调制频率 SJ,250 MHz 时高达 1 UI
    • 双音 SJ、RJ、BUJ、SSC
    • 半周期抖动 (偶数/奇数抖动)
  • PON 突发信号检测和 EDFA 环路测试
  • 灵活的可扩展插入式模块设计
  • 32.1 Gbaud 4PAM/8PAM 发生器和 4PAM 误码率精确测量
  • 1 Tbit/s 下一代高速传输测试 (32G x 32ch)
  • 无源均衡器


描述:

高质量的仪器提供高精度的结果

Anritsu的信号质量分析仪(MP1800A)集成了可产生业内最高质量,最高振幅信号的脉冲模式发生器(PPG)模块,以及具有最高可用输入灵敏度的错误检测器(ED)模块。

每个MP1800A系列PPG或ED模块的通道数可以从1通道,2通道或4通道中选择,支持多通道同步,最高32 Gbit / s的8个通道。结果,可以同时测量AOC,CFP,CXP,QSFP +等模块的每个通道,从而进行串扰和偏斜容限评估测试。

MP1800A PPG模块提供高达3.5 Vp-p的输出,支持评估EA和EML等调制器。除了生成用于评估E-PON,G-PON和10GE-PON光模块的IEEE和ITU-T突发信号和辅助信号之外,该产品的突发数据和辅助信号输出时序的自动生成可缩短评估时间并提高评估质量。

完整的32G抖动测试,一盒即可恢复时钟
具有低内在抖动PPG,4TAP强调,高灵敏度ED,睁眼补偿均衡器和自动测量软件的Anritsu MP1800A是抖动容限测试的理想整体解决方案。

使用内置的抖动调制源可以生成各种类型的抖动,例如SJ,RJ,BUJ,SSC。抖动调制器以250 MHz的抖动频率生成高达1 UI的宽幅SJ,从而确保了足够的余量用于接收机抖动容限测试。此外,275 fs rms(标称值)的固有抖动非常低,不仅在抖动调制关闭时,而且在抖动打开设置为0 UI时,即使在低抖动幅度下也能确保精确测量。

将MP1800A与4Tap增强功能(MP1825B)结合使用,可以生成高达32.1 Gbit / s的高速互连标准的预增强功能,例如CEI-28G,32G光纤通道和InfiniBand EDR(26G)。每个抽头可以独立更改,以确保准确的预加重。将仪器放置在尽可能靠近DUT的外部远程头位置,可将由于电缆损耗和ISI引起的信号衰减的影响降至最低,从而在DUT接口上保持最高的信号质量。

ED模块具有仅10 mV的高灵敏度,以及1秒或更短的高速自动调整(自动检测阈值电平和相位点),支持对低输出幅度设备(例如,作为AOC。安装Clock Recovery选件后,可以在一盒中使用不同的Tx和Rx时钟进行SERDES的压力抖动容限测试,以及无时钟设备(例如AOC)的BER测量。

当与高灵敏度ED(MU183040B / 41B)结合使用时,无源线性均衡器(J1621A / J1622A)可以对具有低EYE开口的PHY器件进行BER和抖动容限测试。均衡器可补偿印刷电路板(PCB)的走线损耗并改善EYE开度,从而将高频传输线失真的影响降至最低。

超高速信号生成和BER测量

MP1800A可以配置为使用4PAM / 8PAM转换器(MZ1834A / MZ1838A)生成表征高速背板和400 GbE接口所需的高质量,低S / N,4PAM和8PAM数据信号。可以同时测量三个4个PAM眼图的误码率。 MP1800A是使用4种PAM信号进行精确BER测量的理想平台,它使用长存储器可编程码型功能和错误屏蔽功能来滤除不需要的错误。

能够同步多达四个MP1800A信号质量分析仪单元,仅Anritsu支持配置高达1 Tbit / s的超高速传输测试系统以及多通道同步信号,例如Quad DP-16QAM和Dual DP-64QAM。


详细信息

Description:

High Quality Instrument Provides Highly Accurate Results

Anritsu’s Signal Quality Analyzer (MP1800A) incorporates a Pulse Pattern Generator (PPG) module for generating the highest-quality, highest-amplitude signals in the industry, as well as an Error Detector (ED) module with the highest input sensitivity available.

The number of channels per MP1800A-series PPG or ED module can be selected from 1ch, 2ch or 4ch, supporting multichannel synchronization for up to 8 channels at 32 Gbit/s. As a result, each channel of AOC, CFP, CXP, QSFP+, etc., modules can be measured simultaneously, enabling crosstalk and skew tolerance evaluation tests.

The MP1800A PPG modules offer outputs up to 3.5 Vp-p, supporting the evaluation of modulators, such as EA and EML. In addition to generating IEEE and ITU-T burst and auxiliary signals for evaluating E-PON, G-PON, and 10GE-PON optical modules, the product’s automated generation of burst data and auxiliary signal output timings shortens evaluation times and improves evaluation quality.

Complete 32G Jitter Testing with Clock Recovery in One Box

Anritsu’s MP1800A with Low-Intrinsic Jitter PPG, 4TAP Emphasis, High-Sensitivity ED, Equalizer for Eye Opening compensation, and automatic measurement software is the ideal total solution for Jitter Tolerance tests.

Various types of jitter, such as SJ, RJ, BUJ, SSC can be generated using the built-in jitter modulation source. The Jitter Modulator generates wide-amplitude SJ up to 1 UI at a Jitter Frequency of 250 MHz, ensuring sufficient margin for receiver Jitter Tolerance tests. Additionally, the Intrinsic Jitter of 275 fs rms (nominal) is extremely low, not only when Jitter modulation is OFF but also when 0 UI is set at Jitter ON, ensuring accurate measurements even at low Jitter amplitudes.

Combining the MP1800A with the 4Tap Emphasis (MP1825B) supports the generation of pre-emphasis for high-speed interconnect standards up to 32.1 Gbit/s, such as CEI-28G, 32G Fibre Channel, and InfiniBand EDR (26G). Each tap can be changed independently assuring accurate pre-emphasis. Positioning the instrument as an external remote head, as close as possible to the DUT, minimizes the impact of signal degradation due to cable-loss and ISI, thus maintaining the highest signal quality at the DUT interface.

The ED module has a high sensitivity of just 10 mV as well as high-speed auto-adjustment of 1 second or less (auto-detects threshold level and phase point), supporting accurate and efficient measurement of low-output-amplitude devices, such as AOCs. Installing the Clock Recovery option enables stress jitter tolerance tests of SERDES with different Tx and Rx clocks and BER measurements of clock-less devices such as AOC in one box.

When used in combination with the High Sensitivity ED (MU183040B/41B) the Passive Linear Equalizers (J1621A/J1622A) enable BER and Jitter Tolerance testing of PHY devices with low EYE openings. The equalizers compensate for printed circuit board (PCB) trace loss and improve EYE opening, thus minimizing the impact of high frequency transmission line distortion.

Ultra High-Speed Signal Generation and BER Measurement

The MP1800A can be configured to generate the high quality, low S/N, 4PAM and 8PAM data signals required for the characterization of high-speed backplanes and 400 GbE interfaces using the 4PAM/8PAM Converter (MZ1834A/MZ1838A). The bit error rates of three 4 PAM eye patterns can be measured simultaneously. The MP1800A is the ideal platform for accurate BER measurements of 4 PAM signals using the long-memory programmable pattern function and error-mask function for filtering out unwanted errors.

With the ability to synchronize up to four MP1800A Signal Quality Analyzer units, only Anritsu supports the configuration of an ultra-high-speed transmission test system up to 1 Tbit/s with multi-channel synchronization signals, such as Quad DP-16QAM and Dual DP-64QAM.


Features

  • Highly expandable, plug-in, modular design bit error rate tester (BERT)
  • Bit Error Rate test from 0.1 Gbit/s to 32.1 Gbit/s; 64.2 Gbit/s with external MUX/DeMUX
  • Supports signal integrity analysis for a variety of 100G+ applications
    • High speed backplane and interconnect
    • High speed chip/device
    • Active optical cable
    • Optical transceiver modules
  • High-quality (12 ps rise/fall time) and low-jitter (8 ps p-p) PPG waveform, up to 3.5 Vp-p
  • Jitter tolerance test up to 32.1 Gbit/s
    • SJ up to 2000 UI. High modulation frequency SJ up to 1 UI at 250 MHz
    • Support generation of dual tone SJ, RJ, BUJ, and SSC
    • Half Period Jitter (Even/Odd Jitter)
  • Ultra high sensitivity Error Detector (10 mV typical) with embedded clock recovery
  • 32.1 Gbit/s 4Tap Emphasis with external MP1825B
  • Crosstalk test and skew tolerance test using synchronized multi-channel PPG
  • Passive Linear Equalizers for improved EYE opening
  • Comprehensive signal analysis including Burst measurement for PON and EDFA loop circuit testing, Bathtub Measurement (TJ, DJ, RJ), Eye Diagram and Eye Margin Measurement
  • 32.1 Gbaud 4PAM/8PAM generators and accurate 4PAM BER measurement
  • 1 Tbit/s Next Gen. High-Speed Transmission Testing (32G x 32ch)

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