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销售泰克 DSA8200 示波器

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产品参数

选件 是否计量 发货周期 保修时间 成色
-- -- 8成新
所在地 机身号 状态 资料下载
深圳市 完好
更新日期:2020-03-28
联系电话:0755-86016691

* 产品描述

特点与优势

  • 最先进的采样示波器,用于通信信号分析,TDR / TDT /串行数据网络分析,重复性超快信号的采集和测量
    • 扩频时钟(SSC)信号的采集
    • 业界唯一的主机,最多支持8个输入通道,以提高灵活性和吞吐量
    • 四个颜色分级的可变余辉波形数据库
    • 具有100多种自动测量的测量系统
    • 完整的通信测量套件包括两种类型的OMA,SSC配置文件以及许多其他类型
    • 自动化的ITU / ANSI / IEEE掩码测试
    • 内置SONET / SDH,FC,以太网和其他标准的掩码和测量
    • 可以从工厂提供的文件中加载掩码更新
    • 掩模余量测试,用于防护带生产测试
  • 采集模块
    • 完全集成的多速率光模块
    • 高达80 GHz的光模块80C10B
    • 某些模块提供高精度的“ ER校准”测量
    • 电气模块,带宽高达70+ GHz,测量上升时间为5 ps(10-90%)
    • 灵活的速率时钟恢复
    • 提供具有SSC(扩频时钟)支持的时钟恢复
  • 抖动,噪声,BER和串行数据链路分析
    • 测量并分离确定性数据相关抖动与随机抖动
    • 测量垂直噪声,将确定性数据相关噪声与随机噪声分开
    • 高精度BER和眼图轮廓估计,支持DDPWS
    • FFE / DFE均衡,发射机均衡
    • 损耗大于30 dB的通道的通道仿真
    • 用于夹具去嵌入的线性滤波器,线性滤波
  • TDR(时域反射仪)
    • 高达50 GHz的TDR带宽,反射上升时间为15 ps,入射上升时间为12 ps
    • 噪声最低为准确重复TDR测量结果- 600μV RMS,50 GHz的
    • 独立的采样器相差校正可确保轻松固定和探头去嵌入
    • 业内唯一的主机,最多可容纳四个真差分TDR或电气通道对,以提高系统的多功能性
  • S参数测量
    • 高达50 GHz的差分,单端,混合模式;插入损耗,回波损耗,频域串扰,模式转换
    • PCI Express,串行ATA,Infiniband,千兆以太网制造以及针对千兆位信号路径和互连的标准一致性测试-包括眼罩测试
    • 直观,简单,准确的串行数据,千兆位数字设计和信号完整性
    • 带有命令行界面的快速准确的自动化多端口S参数测量
  • 业界最佳的标准时基抖动性能,800 fs RMS
  • 业界领先的时基抖动性能,<200 fs RMS * 1可用于相位基准模块
  • 快速采集速率和高吞吐量
  • 远程采样器可将其放置在DUT附近,以实现卓越的信号保真度
  • 具有眼图平均的FrameScan™采集模式:
    • 隔离与数据相关的故障
    • 检查低功率信号
  • MS Windows XP操作系统
  • 先进的连接到3 第三方软件

应用领域

  • 电信和数据通信组件与系统的设计/验证
  • 符合ITU / ANSI / IEEE / SONET / SDH的制造/测试
  • 高性能真差TDR测量
  • 先进的抖动,噪声和BER分析
  • 包含S参数的串行数据应用的阻抗表征和网络分析
  • 基于通道和眼图仿真和测量的SPICE建模

1典型值,对于相位参考模块,某些条件适用。如果不使用该模块,则抖动<800 fs RMS(典型值)。

卓越的性能和非凡的多功能性

为了开发当今的高速串行设备,DSA8200数字串行分析仪采样示波器是用于通信,计算机和消费类电子产品千兆位发射机和信号路径表征以及一致性验证的最通用的工具。DSA8200具有出色的带宽,信号保真度和最可扩展的模块化架构,可为当前和新兴的串行数据技术提供最高性能的TDR和互连分析,最准确的信号损伤分析以及BER计算。

DSA8200提供无与伦比的测量系统保真度和超低抖动底限,可确保最准确地采集高速信号。使用相位参考模块,可以从200 fs的采集抖动中获得高级分析优势。DSA8200可以在相位参考模块的帮助下,朝着采样示波器迈出的又一步,可以获取和测量SSC(扩频时钟)信号。

多处理器架构具有专用的每插槽数字信号处理器(DSP),可提供快速的波形采集速率,从而减少了可靠表征和一致性验证所需的测试时间。

DSA8200的通用模块化体系结构支持大量不断增长的插件系列,使您可以使用各种电气,光学和附件模块来配置您的测量系统,这些模块现在和将来都最适合您的应用。DSA8200具有6个模块插槽,可以同时容纳时钟恢复模块,精密相位参考模块以及多个电或光采集模块,因此您可以将系统性能与不断变化的需求相匹配。

电模块系列具有行业领先的信号保真度,其带宽性能从12 GHz到70+ GHz。两个带远程采样器的真差分时域反射仪(TDR)模块提供高达50 GHz的带宽,15 ps的反射上升时间和12 ps的入射上升时间。的低噪声可变带宽电模块的家庭提供了与远程采样业界最佳的噪声性能,具有450μV RMS噪声在60GHz,和300μV RMS在30千兆赫。

DSA8200光学模块提供完整的光学测试解决方案,具有从125 Mb / s到43 Gb / s甚至更高的出色系统保真度。该模块涵盖单模和多模光纤的一系列波长。每个模块可以可选地配置有多个可选的光学参考接收器(ORR)滤波器和/或全带宽路径。80C07B,80C08C和80C11可以配置许多可用的灵活集成时钟恢复选件。80C12和80C14多速率模块时钟恢复支持可通过电气输出与80A05模块或CR175A / CR125A仪器配合使用来实现。

DSA8200流行的FrameScan™采集模式可与DUT,BERT和其他来源的码型配合使用,以隔离发射机中码型相关的效应,或显示掩码违规之前的位序列。FrameScan自动对时基进行排序,以便按时间顺序获取数据流的每个位。当与DSA8200的模板测试条件采集功能结合使用时,例如在模板命中后停止,FrameScan可以自动识别与模式相关的故障发生在哪一位。

此外,支持各种功能的专用模块,例如单端和差分电时钟恢复,TDR的静电保护以及与流行的TekConnect探测系统的连接性,可为您提供泰克用于高阻抗的最新探头的性能和差分探测。还提供用于50Ω探测和TDR探测的低阻抗探头。

抖动,噪声,BER和串行数据链路分析

三种软件解决方案支持高速串行数据链路测量和分析:80SJARB80SJNB Essentials80SJNB Advanced

80SJARB是基本的抖动测量工具,能够测量任意波形(随机或重复)上的抖动。采集的简单性限制了可能的分析量,因此只能使用最简单的分解。重复性取决于模式。

80SJNB Essentials提供对抖动,噪声和BER的完整分析,并通过分解组件来清楚地了解信号的问题和余量。采集方法需要重复的模式。相对于80SJARB,精度和可重复性都得到了提高,因为该工具可以访问完整的信号模式。

80SJNB Advanced为串行数据链路分析的80SJNB Essentials添加了功能-夹具的去嵌入,通道仿真,FFE / DFE均衡,预加重/去加重。

TDR(时域反射仪)

DSA8200是业界性能最高的全集成时域反射仪(TDR)测量系统。提供高达50 GHz带宽的真差分TDR测量,反射上升时间为15 ps,入射上升时间为12 ps,您可以跟上当今最苛刻的串行数据网络分析(SDNA)要求。

80E10和80E08 TDR模块具有完全集成的独立双通道2米远程采样器系统,以最大程度地减少固定装置并确保最佳的系统保真度。独立的采样器去歪斜确保快速,轻松地固定和探头去嵌入。用户可以通过使用来自差分模块的TDR步骤来驱动一对线对,同时使用第二个差分模块监视第二对线对来表征差分串扰。

详细信息

Features & Benefits

  • State-of-the-Art Sampling Oscilloscope for Communication Signal Analysis, TDR / TDT / Serial Data Network Analysis, Acquisition, and Measurements of Repetitive Ultrafast Signals
    • Acquisition of Spread Spectrum Clocking (SSC) Signals
    • Industry’s Only Mainframe to Support up to 8 Input Channels for Increased Flexibility and Throughput
    • Four Color-graded, Variable Persistence Waveform Databases
    • Measurement System with Over 100 Automated Measurements
    • Complete Suite of Communications Measurements includes Both Types of OMA, SSC Profile, and Many Others
    • Automated ITU/ANSI/IEEE Mask Testing
    • Masks and Measurements for SONET/SDH, FC, Ethernet, and Other Standards Built-in
    • Mask Updates can be Loaded from Factory-supplied File
    • Mask Margin Testing for Guard Banding Production Testing
  • Acquisition Modules
    • Fully Integrated Multirate Optical Modules
    • Optical Modules up to 80 GHz 80C10B
    • High-accuracy "ER Calibrated" Measurement Available in Some Modules
    • Electrical Modules up to 70+ GHz Bandwidth and 5 ps Measured Rise Time (10-90%)
    • Flexible Rate Clock Recovery
    • Clock Recovery with SSC (Spread Spectrum Clocking) Support Available
  • Jitter, Noise, BER, and Serial Data Link Analysis
    • Measures and Separates Deterministic Data-dependent Jitter from Random Jitter
    • Measures Vertical Noise, Separating Deterministic Data-dependent Noise from Random Noise
    • Highly Accurate BER and Eye Contour Estimation, Support for DDPWS
    • FFE/DFE Equalization, Transmitter Equalization
    • Channel Emulation for Channels with >30 dB of Loss
    • Linear Filter for Fixture De-embedding, Linear Filtering
  • TDR (Time Domain Reflectometry)
    • Up to 50 GHz TDR Bandwidth with 15 ps Reflected Rise Time and 12 ps Incident Rise Time
    • Lowest Noise for Accurate Repeatable TDR Measurement Results – 600 μVRMS at 50 GHz
    • Independent Sampler Deskew ensures Easy Fixture and Probe De-embedding
    • Industry’s Only Mainframe to Accommodate up to Four True-differential TDR or Electrical Channel Pairs for Increased System Versatility
  • S-parameter Measurements
    • Up to 50 GHz Differential, Single Ended, Mixed Mode; Insertion Loss, Return Loss, Frequency Domain Crosstalk, Mode Conversion
    • PCI Express, Serial ATA, Infiniband, Gigabit Ethernet Manufacturing, and Standard Compliance Testing for Gigabit Signal Path and Interconnects – Including Eye Mask Tests
    • Intuitive, Easy, and Accurate for Serial Data, Gigabit Digital Design, and Signal Integrity
    • Fast and Accurate Automated Multiport S-parameter Measurements with Command Line Interface
  • Industry’s Best Standard Time-base Jitter Performance, 800 fsRMS
  • Industry-leading Time-base Jitter Performance, <200 fsRMS*1 Available with Phase Reference Module
  • Fast Acquisition Rate and High Throughput
  • Remote Samplers enabling Placement Near DUT for Superior Signal Fidelity
  • FrameScan™ Acquisition Mode with Eye Diagram Averaging:
    • Isolate Data-dependent Faults
    • Examine Low-power Signals
  • MS Windows XP Operating System
  • Advanced Connectivity to 3rd party Software

Applications

  • Design/Verification of Telecom and Datacom Components and Systems
  • Manufacturing/Testing for ITU/ANSI/IEEE/SONET/SDH Compliance
  • High-performance True-differential TDR Measurements
  • Advanced Jitter, Noise, and BER Analysis
  • Impedance Characterization and Network Analysis for Serial Data Applications including S-parameters
  • Channel and Eye Diagram Simulation and Measurement-based SPICE Modeling

*1 Typical, with the Phase Reference module, some conditions apply. Without the module, the jitter is <800 fsRMS (typical).

Superior Performance with Extraordinary Versatility

For developing today’s high-speed serial devices, the DSA8200 Digital Serial Analyzer sampling oscilloscope is the most versatile tool for communication, computer and consumer electronics gigabit transmitter and signal path characterization, and compliance verification. With exceptional bandwidth, signal fidelity, and the most extensible modular architecture, the DSA8200 provides the highest performance TDR and interconnect analysis, most accurate analysis of signal impairments, and BER calculations for current and emerging serial data technology.

The DSA8200 provides unmatched measurement system fidelity with ultra-low jitter floor that ensures the most accurate acquisition of high-speed signals. You get advanced analysis benefits from the 200 fs acquisition jitter with the Phase Reference module. And in another step forward for a sampling oscilloscope, with the help of the Phase Reference module the DSA8200 can acquire and measure SSC (Spread Spectrum Clocking) signals.

The multiprocessor architecture, with dedicated per-slot digital signal processors (DSPs), provides fast waveform acquisition rates, reducing the test times necessary for reliable characterization and compliance verification.

The DSA8200’s versatile modular architecture supports a large and growing family of plug-ins enabling you to configure your measurement system with a wide variety of electrical, optical, and accessory modules that best suit your application now and in the future. With 6 module slots, the DSA8200 can simultaneously accommodate a Clock Recovery module, a precision Phase Reference module, and multiple acquisition modules, electrical or optical, so you can match system performance to your evolving needs.

Featuring industry-leading signal fidelity, the family of electrical modules includes bandwidth performance from 12 GHz to 70+ GHz. Two true-differential Time Domain Reflectometer (TDR) modules, with remote samplers, offer up to 50 GHz bandwidth and 15 ps reflected rise time and 12 ps incident rise time. The family of low-noise variable-bandwidth electrical modules provides the industry's best noise performance with remote samplers, featuring 450 μVRMS noise at 60 GHz, and 300 μVRMS at 30 GHz.

DSA8200 optical modules provide complete optical test solutions with superior system fidelity from 125 Mb/s to 43 Gb/s and beyond. The modules cover a range of wavelengths for both single- and multi-mode fibres. Each module can be optionally configured with a number of selectable optical reference receiver (ORR) filters and/or a full bandwidth path. The 80C07B, 80C08C, and 80C11 can be configured with a number of available flexible integrated clock recovery options. The 80C12 and 80C14 Multirate module clock recovery support is achieved with an electrical output for use with the 80A05 module, or CR175A/CR125A instruments.

The DSA8200’s popular FrameScan™ acquisition mode can be used with patterns from DUTs, BERTs, and other sources, to isolate pattern-dependent effects in transmitters or show the bit sequence preceding a mask violation. FrameScan automatically sequences the time base so that each bit of the data stream is acquired in time order. When used in combination with mask-testing conditional acquisition features of the DSA8200, such as stop after mask hits, FrameScan can automatically identify at which bit a pattern-dependent failure occurred.

In addition, specialized modules supporting features such as single-ended and differential electrical clock recovery, electrostatic protection for the TDR, and connectivity to the popular TekConnect probing system brings you the performance of Tektronix state-of-the-art probes for high-impedance and differential probing. Low-impedance probes for 50 Ω probing and for TDR probing are also available.

Jitter, Noise, BER, and Serial Data Link Analysis

High-speed serial data link measurements and analysis are supported with three software solutions: 80SJARB80SJNB Essentials, and 80SJNB Advanced.

80SJARB is a basic jitter measurement tool capable of measuring jitter on any waveform – random or repetitive. The simplicity of acquisition limits the amount of analysis possible so only the simplest decomposition can be used; repeatability is pattern dependent.

80SJNB Essentials offers complete analysis of jitter, noise, and BER, with decomposition of components for clear understanding of a signal’s problems and margins. The acquisition methodology requires a repetitive pattern. Both accuracy and repeatability are improved relative to 80SJARB since the tool has access to the complete signal pattern.

80SJNB Advanced adds features to 80SJNB Essentials for Serial Data Link Analysis – de-embedding of fixture, channel emulation, FFE/DFE equalization, pre-emphasis/de-emphasis.

TDR (Time Domain Reflectometry)

The DSA8200 is the industry’s highest performance fully integrated Time Domain Reflectometry (TDR) measurement system. Offering true-differential TDR measurements up to 50 GHz bandwidth with 15 ps reflected rise time and 12 ps incident rise time, you are able to keep pace with today’s most demanding Serial Data Network Analysis (SDNA) requirements.

The 80E10 and 80E08 TDR modules feature a fully integrated independent dual-channel 2-meter remote sampler system to minimize fixturing and assure optimal system fidelity. Independent sampler deskew ensures fast and easy fixture and probe de-embedding. The user can characterize differential crosstalk by using TDR steps from a differential module to drive one line pair while monitoring a second line pair with a second differential module.


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