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销售安捷伦 4396A 网络分析仪

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选件 是否计量 发货周期 保修时间 成色
-- 不保修 8成新
所在地 机身号 状态 资料下载
深圳市 未知
更新日期:2021-04-06
联系电话:0755-86016691

* 产品描述

附加功能:

  • 全矢量网络和频谱测量与分析
  • 宽动态范围网络测量,扫描速度快
  • ±0.05dB /±0.3°动态幅度/相位精度
  • 极快的窄带光谱测量
  • 从100 kHz到1.8 GHz的网络分析,1 MHz分辨率
  • 集成源-60至+20 dBm,分辨率为0.1 dB
  • 测量包括:衰减,带宽,中心频率,复阻抗,增益/损耗,相位,线性,VSWR等
  • 2 Hz至1.8 GHz,1 Hz至3 MHz RBW的频谱分析
  • 频谱分析仪的测量包括相邻信道功率,载波噪声,平坦度,频率,谐波失真,相位噪声,占用带宽,灵敏度等
  • 彩色CRT和内置磁盘驱动器/ RAM磁盘
  • GPIB

Agilent 4396A为实验室和生产应用提供了出色的RF矢量网络和频谱测量。可以使用一种仪器来测量通常用于评估组件和电路所需的增益,相位,群时延,失真,寄生,CN和噪声测量。与测试仪结合使用时,Agilent HP 4396A可以提供反射测量,例如回波损耗,SWR和S参数。作为矢量网络分析仪,Agilent 4396A在100 kHz至1.8 GHz的频率范围内以1 MHz的分辨率运行,其集成的合成源以0.1dB的分辨率提供-60至+ 20dBm的输出功率。动态幅度和相位精度分别为±0.05 dB和±0.3°,因此它可以准确地测量增益和群延迟平坦度,这在现代电子系统中变得越来越重要。


作为频谱分析仪,Agilent 4396A的工作频率范围为2 Hz至1.8 GHz,分辨率带宽(RBW)的范围为1-3-10,范围为1 Hz至3 MHz。完全合成的本地振荡器可以进行稳定而准确的频率分析。直接A / D转换(不使用LOG放大器)可产生+/- 1.0 dB的整体电平精度。噪声边带从低于1 GHz的载波偏移到-105 dBc / Hz以下,而灵敏度在10 MHz时为-150 dBm / Hz,在1 GHz时为-147 dBm。此外,具有分屏格式的被测设备的两个网络和频谱(或透射和反射)特性。例如,可以同时显示放大器的频率响应(网络测量)和失真(频谱测量)。


极快的频谱测量
HP 4396A具有步进式快速傅立叶变换(FFT)数字信号处理(DSP)技术,其窄带频谱测量速度比扫频频谱分析仪快20至100倍。当分辨率带宽(RBW)设置为3 kHz或更低时,执行步进FFT。例如,在30 Hz RBW和10 kHz跨度的情况下,HP 4396A的扫描时间为400 ms,而扫频频谱分析仪则需要几十秒。步进式FFT可以大大提高窄带频谱测量的效率,例如VCO或CN测量的频率调谐。


时间
选通频谱分析通过选件1D6,Agilent 4396A提供了时间选通频谱分析功能,以捕获和测量视频,磁盘驱动器,通信设备等中的重复脉冲串信号。最小栅极长度为2微秒,因此甚至可以分析窄脉冲信号。


阻抗测量功能和RF阻抗测试套件
通过添加选件010和HP 43961A RF阻抗测试套件,可以将功能齐全的阻抗测量功能(适用于快速检查通用阻抗应用程序)。覆盖从100 kHz到1.8 GHz的阻抗参数Z,Θ,C,L,Q,D等,可以直接测量并显示在CRT上。基本阻抗精度(典型值)为3%。Agilent 43961A RF阻抗测试套件是为Agilent 4396A设计的,需要利用选件010的功能。该套件上装有APC-7®连接器,可轻松连接至适当的阻抗测试夹具。该测试套件可使用多种HP夹具,包括与Agilent 4291A RF阻抗/材料分析仪一起使用的新型表面安装设备(SMD)夹具。为了获得更高的精度,

详细信息

Additional Features:

  • Full vector network and spectrum measurements and analysis
  • Wide dynamic range network measurement with fast sweep speeds
  • ±0.05dB/±0.3° dynamic magnitude/phase accuracy
  • Extremely fast narrow band spectrum measurement
  • Network analysis from 100 kHz to 1.8 GHz, 1 MHz resolution
  • Integrated source -60 to +20 dBm with 0.1 dB resolution
  • Measurements include: attenuation, bandwidth, center frequency, complex impedance, gain/loss, phase, linearity, VSWR and more
  • Spectrum analysis from 2 Hz to 1.8 GHz, 1 Hz to 3 MHz RBW
  • Spectrum analyzer measurements include adjacent channel power, carrier-to-noise, flatness, frequency, harmonic distortion, phase noise, occupied bandwidth, sensitivity, and more
  • Color CRT and built-in disk drive/RAM disk
  • GPIB

The Agilent 4396A provides excellent RF vector network and spectrum measurements for lab and production applications.  Gain, phase, group delay, distortion, spurious, CN, and noise measurements often required for evaluating components and circuits can be measured using one instrument.  When combined with a test set, the Agilent HP 4396A provides reflection measurements, such as return loss, and SWR, and S parameters. As a vector network analyzer, the Agilent 4396A operates from 100 kHz to 1.8 GHz with 1 MHz resolution and its integrated synthesized source provides -60 to +20dBm of output power with 0.1dB resolution.  The dynamic magnitude and phase accuracy are ±0.05 dB and ±0.3° so that it can accurately measure gain and group delay flatness, which are becoming more important in modern electronics systems.



As a spectrum analyzer, the Agilent 4396A operates from 2 Hz to 1.8 GHz with resolution-bandwidths (RBWs) spanning 1 Hz to 3 MHz in a 1-3-10 sequence. A fully synthesized local oscillator allows stable and accurate frequency analysis. Direct A/D conversion (no LOG amplifier is used) results in +/-1.0 dB overall level accuracy. Noise sidebands fall below -105 dBc/Hz offset from carriers below 1 GHz, while sensitivity is -150 dBm/Hz at 10 MHz and -147 dBm at 1 GHz. In addition, with two network and spectrum (or transmission and reflection) characteristics of the device under test in split-screen format. For example, an amplifier's frequency response (network measurement) and distortion (spectrum measurement) can be shown at the same time.


Extremely Fast Spectrum Measurement
The HP 4396A features a stepped Fast Fourier Transform (FFT) digital-signal-processing (DSP) technique for 20 to 100 times faster narrow band spectrum measurement than swept-tuned spectrum analyzers. The stepped FFT is performed when the resolution bandwidth (RBW) is set it 3 kHz or below. For example, with a 30 Hz RBW and 10 kHz span, the HP 4396A has a sweep time of 400 ms, while swept-tuned spectrum analyzers take a few tens of seconds. The stepped FFT can greatly improve the efficiency of narrow band spectrum measurement such as frequency tuning of a VCO or CN measurements.


Time-Gated Spectrum Analysis
With Option 1D6, the Agilent 4396A offers time-gated spectrum analysis capability to capture and measure repetitive burst signals in video, disk drives, communication equipment, and more. The minimum gate length is 2 µsec so that even narrow burst signals can be analyzed.


Impedance Measurement Function and RF Impedance Test Kit
A full-featured impedance measurement function (useful for quick-­check general-purpose impedance applications) can be added to the Agilent 4396A by adding Option 010 and the HP 43961A RF impedance test kit. Covering from 100 kHz to 1.8 GHz, impedance parameters Ζ, Θ, C, L, Q, D, and more, are directly measured and displayed on the CRT. The basic impedance accuracy (typical value) is 3%. The Agilent 43961A RF impedance test kit is designed for the Agilent 4396A and is required to utilize the features of Option 010. An APC-7® connector is mounted on this kit for easy connection to an appropriate impedance test fixture. A wide variety of HP fixtures can be used with the test kit, including the new surface-mount-device (SMD) fixtures used with the Agilent 4291A RF impedance/material analyzer. For higher accuracy, complete impedance analysis over the widest impedance ranges, and temperature effects evaluation the HP 4291A impedance/material analyzer is recommended.


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