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| 选件 | 是否计量 | 发货周期 | 保修时间 | 成色 |
|---|---|---|---|---|
| 否 | 1-4周 | 12- | 8成新 | |
| 所在地 | 机身号 | 状态 | 资料下载 | |
| 深圳市 | 完好 |
主要特点：
描述：
4191A RF阻抗分析仪可测量14个参数，最大分辨率为4.5位。内部合成器可提供1 MHz至1000 MHz的可变频率，覆盖具有自动扫描功能的UHF，VHF和视频频段。具有自动扫描功能的内部直流偏置电源以10 mV的步幅覆盖±40 V的电压范围。
HP 4191A允许在广泛的测量范围内进行可靠的测量。独特的纠错能力和经过特殊设计的测试装置可实现其出色的可重复性，频率响应和准确性。这些功能使HP 4191A可用于评估电子材料，组件和电路。
内部合成器可提供100 Hz的最大分辨率（选件002），精度为3 ppm，从而可以轻松检测被测设备的谐振频率的微小变化。扫频功能有助于分析设备的频率特性。
可以将两个完整的前面板设置（参数选择和扫描控制）存储在非易失性存储器中，并可以通过一次按键操作随时调用。这与标准的HP-IB接口一起，使HP 4191A作为独立或系统仪器都非常高效。
这些独特的功能可将其广泛应用于以下领域：（1）半导体测试，例如高频下的表面状态评估（CV / GV和电导（G / ww）特性），以及二极管和晶体管的输入/输出阻抗评估， （2）谐振器，滤波器以及磁性和介电材料测试，（3）评估LCR组件（例如高频芯片和引线组件），以及（4）测试与通信相关的组件（例如电缆，连接器等）。
description：
The 4191A RF Impedance Analyzer measure 14 parameters with a maximum resolution of 4.5 digits. The internal synthesizer provides variable frequencies from 1 MHz through 1000 MHz covering the UHF, VHF, and video bands with automatic sweep capability. An internal dc bias supply with auto sweep function covers the voltage range of ± 40 V in 10 mV steps.
The HP 4191A permits reliable measurements over a wide measuring range. Its outstanding repeatability, frequency response, and accuracy are made possible by a unique error-correction capability and specially designed test fixtures. These features allow the HP 4191A to be used in evaluating electronic materials, components, and circuitry.
The internal synthesizer provides a maximum resolution of 100 Hz (option 002) with an accuracy of 3 ppm, allowing small changes in the resonant frequency of the device under test to be easily detected. The swept frequency capability aids in the analysis of frequency characteristics of the device.
Two complete front-panel settings (parameter selection and the sweep control) can be stored in a non-volatile memory and recalled at any time with a single key operation. This, together with the standard HP-IB interface, makes the HP 4191A extremely efficient as either a standalone or a systems instrument.
These unique features permit very wide applications in : (1) semi-conductor testing such as surface state evaluation at high frequencies (C-V/G-V and conductance (G/w-w) characteristics), and the input/output impedance evaluation of diodes and transistors, (2) resonator, filter, and magnetic and dielectric materials testing, (3) evaluation of LCR components such as high-frequency chip and leaded components, and (4) testing of communications-related components such as cables, connectors, etc.
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