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选件 | 是否计量 | 发货周期 | 保修时间 | 成色 |
---|---|---|---|---|
否 | 1-4周 | 12- | 8成新 | |
所在地 | 机身号 | 状态 | 资料下载 | |
深圳市 | 完好 |
2600B系列SourceMeter电流/电压源和测量仪器均采用吉时利第三代SMU技术构建。每个紧密集成的仪器均具有以下功能:精密电源,真实电流源,6位数字万用表,任意波形发生器,脉冲发生器和电子负载。2600B系列SourceMeter型号具有基于Java的内置测试软件,该软件可以通过世界各地的任何浏览器,任何计算机上的真实即插即用I / V特性进行表征。2600B系列是功能强大的仪器系列,具有在包括研发,生产测试,培训和QA / FA在内的许多应用中测试组件和设备的独特功能。
•4象限电压/电流源,并以6位数的分辨率进行测量(2行VFD显示)
•从系列中选择型号,以提供出色的动态范围,10A脉冲至0.1fA和200V至100nV
•内置基于Java的测试软件
•测试脚本处理(TSP)技术嵌入了完整的测试程序,以实现同类最佳的系统级吞吐率
•TSP-Link扩展技术用于无需大型机的多通道并行测试
•USB 2.0,LXI-C,GPIB,RS-232和数字I / O接口
•提供的软件驱动程序和开发/调试工具
•型号选择包括规格较低的(2604B,2614B,2634B)仪器
•半导体结构
-晶片/薄膜
•纳米材料和器件
-石墨烯/碳纳米管/纳米线/低功率纳米结构
•分立和无源组件
-电阻器/二极管/齐纳二极管/ LED,磁盘驱动器头,传感器
-小信号双极结型晶体管( BJT's,场效应晶体管(FET)
•有机材料和器件
-电子链接/可印刷电子
•材料特性
-电阻率/霍尔效应
Series 2600B SourceMeter current/voltage source and measurement instruments are built from Keithley's 3rd generation SMU technology. Each tightly integrated instrument offers the capabilities of a precision power supply, true current source, 6 digit DMM, arbitrary waveform generator, pulse generator and electronic load. Series 2600B SourceMeter models feature built-in Java-based test software which enables true plug & play I/V characterisation through any browser, on any computer, from anywhere in the world. Series 2600B is a family of powerful instruments with unique capabilities in testing components and devices across many applications including R&D, production test, education and QA/FA.
• 4-quadrant voltage/current source and measure with 6 digit resolution (2-line VFD display)
• Choose model from series offering exceptional dynamic range, 10A pulse to 0.1fA and 200V to 100nV
• Built-in Java-based test software
• Test Script Processing (TSP) technology embeds complete test programs for best-in-class system-level throughput
• TSP-Link expansion technology for multi-channel parallel test without a mainframe
• USB 2.0, LXI-C, GPIB, RS-232 and digital I/O interfaces
• Software drivers and development/debug tools supplied
• Model choice includes lower specification (2604B, 2614B, 2634B) instruments
• Semiconductor Structures
- Wafers / Thin films
• Nanomaterials and Devices
- Graphene / Carbon Nanotubes/ Nanowires /Low Power nanostructures
• Discrete and Passive Components
- Resistors / diodes / Zener Diodes / LEDs, disk drive heads, sensors
- small signal bipolar junction transistors (BJT’s), Field Effective Transistors
(FET’s)
• Organic Materials and Devices
- E-links / Printable Electronics
• Material Characterization
- Resistivity / Hall Effect
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