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|---|---|---|---|---|
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描述：
Agilent 4155B是新一代精密半导体器件参数分析仪。它拥有***的数字扫描参数分析仪，可靠的测试仪，强有力的故障，分析工具，自动检查设施；幸免综合至同参仪器中。新产品的设计目标清楚地瞄准为亚微米几何尺寸器件评估提供前所未见的精度和功能。它是一种可灵活使用的仪器，无疑对从材料评价至器件性牟的表征，乃至最封装等各个阶段的部分检查和现场故障分析可提供诸多应用，以改进半导体器件的质量。正确方案的抉择Agilent 4155B设有四个内置源/监测单元（SMU），两个电压单元（VSU），两个电压监测单元（VMU），对于具有非开氏连接的基本半导体连接，4155B可谓是***选择，分辨为10fA/1μV测量范围为100mA/100V。任何时候，均可增添41501B SMU和脉冲发生器扩展器。它由0V/1.6A接地单元馈送可扩展接收两100mA/100V SMU或一个1A/200V SMU和两上同步40V/1μs脉冲发生器。设定和测量Agilent 4155B可使用许多测量单元，包括Agilent 41501B做阶梯，脉冲扫描测量，采样（时域）测量，而无需变动连接。进而，对于可靠性评估还可做应力循环测量，例如热载流子的注入和快速EEPROM测评。可通过前面板键，键盘，或GPIB（SCPI命令）多种途径通过设置页面和添入空格进行设定和测量，还可通过钮扫描功能进行短暂测量和查寻设定一类似于曲线描图仪。显示和分析测量和分析结果显示在彩色的LCD上，可由4个图形存贮器做存贮器做存贮，以便分析。比较。强有力的分析手段，使得很容易对诸如hFE,Vth等多种参数进行抽取。一旦查得参数抽取条件，则可通过-自动分析功能自动地取得。输出和存贮设定、测量，分析数据均可由GPIB，燕行或网络接口10Base-T LAN输出至彩色绘图仪和打印机，也可通过网络或3.5寸盘存贮在MS-DOS或LIF格式文件中。Graphic (Agilent-GL,PCL功TIF）输出文件还允许将图形转换为桌面出版软件。重复和自动测试Agilent 4155B的Agilent仪器BASIC控制器，可在无控制器的外部仪器构成自动测量系统。4155B可通过多用触发I/O功能与外部仪器相同步
description:
The Agilent 4155B is a new generation of precision semiconductor device parameter analyzers. It has a digital scanning parameter analyzer, a reliable tester, powerful faults, analytical tools, and automatic inspection facilities; it is spared from the same instrument. The new product's design goals are clearly aimed at providing unprecedented precision and functionality for submicron geometry device evaluation. It is a flexible instrument that undoubtedly provides a number of applications for improving the quality of semiconductor devices from the evaluation of materials to the characterization of device properties, to the partial inspection and field failure analysis of the most packaging stages. The Choice of the Right Solution The Agilent 4155B features four built-in source/monitor units (SMUs), two voltage units (VSUs), and two voltage monitoring units (VMUs). For basic semiconductor connections with non-Kelvin connections, the 4155B is a ***Select, the resolution is 10fA/1μV and the measurement range is 100mA/100V. The 41501B SMU and pulse generator expander can be added at any time. It is powered by a 0V/1.6A ground unit feed that can be extended to receive two 100mA/100V SMUs or one 1A/200V SMU and two up-synchronous 40V/1μs pulse generators. Setting Up and Measuring The Agilent 4155B can be used with many measurement units, including the Agilent 41501B for step, pulse sweep measurements, and sampling (time domain) measurements without the need for a change connection. Furthermore, stress cycle measurements such as hot carrier injection and fast EEPROM evaluation can be performed for reliability evaluation. It can be set and measured by setting the page and adding spaces through various functions such as front panel keys, keyboard, or GPIB (SCPI command). It can also be used for short measurement and search setting by the button scanning function, similar to the curve tracer. Display and Analysis Measurements and analysis results are displayed on a color LCD that can be stored by four graphics memories for analysis. Comparison. Powerful analysis means that it is easy to extract various parameters such as hFE and Vth. Once the parameter extraction conditions are found, they can be automatically obtained by the -automatic analysis function. Output and storage settings, measurements, and analysis data can be exported to color plotters and printers by GPIB, Yanxing or network interface 10Base-T LAN, or stored in MS-DOS or LIF format files via network or 3.5-inch disk. in. The Graphic (Agilent-GL, PCL Work TIF) output file also allows the conversion of graphics to desktop publishing software. Repeat and automatically test the Agilent 4155B's Agilent instrument BASIC controller to form an automated measurement system in a controller-free external instrument. The 4155B can be synchronized with external instruments through multi-purpose trigger I/O functions.
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