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销售吉时利 6220 直流电源

浏览次数:1395

产品参数

选件 是否计量 发货周期 保修时间 成色
1-4天 12- 8成新
所在地 机身号 状态 资料下载
深圳市 未知
更新日期:2020-09-15
联系电话:0755-86016691

* 产品描述

产品特点:

  • 直流精密电流源
  • 源和同步(可编程负载)100fA至100mA
  • 1014W的输出阻抗可确保稳定地向可变负载提供电流
  • 65000点源存储器允许直接从当前源执行全面的测试电流扫描
  • 内置RS-232,GPIB,触发链接和数字I / O接口
  • 可重新配置的三轴输出简化了与应用程序防护要求的匹配
  • 220型仿真模式消除了对现有应用程序进行重新编程的需要
  • 应用范围:
  • 纳米技术,差分电导,脉冲源和电阻
  • 脉冲IV光电
  • 低功耗测量电阻
  • 低噪音测量电阻


吉时利6220直流电流源表将易用性与极低的电流噪声结合在一起。低电流源对于从研发到生产的测试环境中的应用至关重要,特别是在半导体,纳米技术和超导体行业中。6220的高源精度和内置控制功能使其成为霍尔测量,使用增量模式的电阻测量,脉冲测量和差分电导测量等应用的理想选择。

对精密,低电流源的需求

对于当今非常小巧的高能效电子产品,其设备测试和表征要求提供低电流水平,这要求使用精密的低电流源。较低的激励电流会在设备上产生较低的电压,并且难以测量。

简单编程

两种电流源都可以通过前面板控件或通过RS-232或GPIB接口从外部控制器进行完全编程。6220可以提供100fA至105mA的直流电流。输出电压可以10mV为单位在0.1V至105V范围内设置。电压合规性(限制了电流供应时施加的电压量)对于过电压可能损坏被测设备(DUT)的应用至关重要。

轻松定义和执行电流斜坡

6220提供了用于定义电流斜坡并使用触发器或计时器逐步完成多达65,536个输出值的预定义序列的工具;它支持线性,对数和自定义扫描。

图1.执行,分析和显示差分电导测量点击查看大图

图1.执行,分析和显示差分电导测量

图2.增量模式可降低1000比1的噪声点击查看大图

图2.增量模式可降低1000比1的噪声

图3. 6220型和免费的示例启动控制软件使通过添加,相乘,串在一起或将滤波器应用于标准波形,可以轻松创建复杂的波形。点击查看大图

图3. 6220型和免费的示例启动控制软件

脉冲测试

测量过程本身所产生的热量即使很小,也会升高DUT的温度,歪曲测试结果甚至损坏设备。

详细信息

Product Features:

  • DC precision current source
  • Source and sync (programmable load) 100fA to 100mA
  • 1014W output impedance ensures stable current sourcing into variable loads
  • 65000-point source memory allows executing comprehensive test current sweeps directly from the current source
  • Built-in RS-232, GPIB, Trigger Link, and digital I/O interfaces
  • Reconfigurable triax output simplifies matching the application's guarding requirements
  • Model 220 emulation mode eliminates need to reprogram existing applications
  • Applications:
  • Nanotechnology, differential conductance, pulsed sourcing and resistance
  • Optoelectronics, pulsed I-V
  • Measuring resistance with low power
  • Measuring resistance with low noise

The Keithley 6220 DC Current Source Meter combines ease-of-use with exceptionally low-current noise. Low-current sourcing is critical to applications in test environments ranging from R&D to production, especially in the semiconductor, nanotechnology, and superconductor industries. High sourcing accuracy and built-in control functions make the 6220 ideal for applications like hall measurements, resistance measurements using delta mode, pulsed measurements, and differential conductance measurements.

The Need for Precision, Low-Current Sourcing

Device testing and characterization for today's very small and power-efficient electronics requires sourcing low-current levels, which demands the use of a precision, low-current source. Lower stimulus currents produce lower - and harder to measure - voltages across the device.

Simple Programming

Both current sources are fully programmable via the front panel controls, or from an external controller via RS-232 or GPIB interfaces. The 6220 can source DC currents from 100fA to 105mA. The output voltage can be set from 0.1V to 105V in 10mV steps. Voltage compliance (which limits the amount of voltage applied when sourcing a current) is critical for applications in which overvoltages could damage the device under test (DUT).

Define and execute current ramps easily

The 6220 offers tools for defining current ramps and stepping through predefined sequences of up to 65,536 output values using a trigger or a timer; it supports linear, logarithmic, and custom sweeps.

Figure 1. Perform, analyze, and display differential conductance measurementsClick for larger image

Figure 1. Perform, analyze, and display differential conductance measurements

Figure 2. Delta mode offers 1000-to-1 noise reductionClick for larger image

Figure 2. Delta mode offers 1000-to-1 noise reduction

Figure 3. The Model 6220 and the free example start-up control software make it easy to create complex waveforms by adding, multiplying, stringing together, or applying filters to standard wave shapes.Click for larger image

Figure 3. The Model 6220 and the free example start-up control software

Pulsed Tests

Even small amounts of heat introduced by the measurement process itself can raise the DUT's temperature, skewing test results or even destroying the device.

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