TAP1500 Single-ended Active FET Probe provides excellent high-speed electrical and mechanical performance required for today's digital system designs.
Key features
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Outstanding electrical performance
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≥1.5 GHz probe bandwidth
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<267 ps rise time
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≤1 pF input capacitance
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1 MΩ input resistance
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-8 V to +8 V input dynamic range
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-10 V to +10 VDC input offset range
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Versatile mechanical performance
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Small compact probe head for probing small geometry circuit elements
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DUT attachment accessories enable connection to SMDs as small as 0.5 mm pitch
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Robust design for reliability
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Easy to use
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Connects directly to oscilloscopes with the TekVPI™ probe interface
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Provides automatic units scaling and readout on the oscilloscope display
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Easy access to oscilloscope probe menu display for probe status/diagnostic information, and to control probe DC offset
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Remote GPIB/USB probe control through the oscilloscope
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Applications
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High-speed Digital Systems Design
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Component Design and Characterization
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Manufacturing Engineering and Test
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Educational Research
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Signals with Voltage Swings up to 16 V
1.5 GHz active probes for TekVPI™ probe interface
Specifically designed for use and direct connection to oscilloscopes with the TekVPI™ probe interface, the TAP1500 Active FET probe achieves high-speed signal acquisition and measurement fidelity by solving three traditional problems:
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Lower DUT loading effects with ≤1 pF input capacitance and 1 MΩ input resistance
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Versatile DUT connectivity for attaching to small SMDs
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Preserves instrument bandwidth at the probe tip for ≤1 GHz oscilloscopes
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