概述和特性
E4991A 射频阻抗/材料分析提供极限阻抗测量性能和功能强大的内置分析功能。它将为元器件和电路设计人员测量 3 GHz 以内的元器件提供创新功能,帮助他们进行研发工作。与反射测量技术不同,E4991A 使用射频电流–电压(RF-IV)技术,可在广泛的阻抗范围内提供更精确的阻抗测量结果。基本阻抗精度是 +/-0.8%。高 Q 精度有利于进行低功耗元器件分析。内置合成器具有 1 MHz到 3 GHz 的扫描范围和 1 mHz的分辨率。
E4991A 提供完整的介电/磁性材料测量解决方案,涵盖 1 MHz 至 1 GHz的宽频率范围。
借助E4991A-010 探针台连接套件,您可轻松地地将 Keysight E4991A 连接到射频探头系统(由 Cascade Microtech 提供)上进行晶圆测量。
温度特性测试套件 E4991A-007 是一款为元器件和材料进行温度特性测量的新型解决方案。该选件可在 - 55°C 至 + 150°C 广泛的温度范围内提供高精度的温度特性分析功能,以及强大的温度漂移补偿功能。
Overview and Features
The E4991A RF impedance/material analyzer offers ultimate impedance measurement performance and powerful built in analysis function. It will provide innovations in R&D of components and circuit designers who evaluate components in the range of 3 GHz. The E4991A uses an RF-IV technique, as opposed to the reflection measurement technique, for more accurate impedance measurement over wide impedance range. Basic impedance accuracy is +/-0.8%. High Q accuracy enables low-loss component analysis. The internal synthesizer sweeps frequency from 1 MHz to 3 GHz with 1 mHz resolution.
Material evaluation
The E4991A provides the total dielectric/magnetic material measurement solutions in wide frequency range (1 MHz to 1 GHz).
On-wafer measurement
The E4991A-010, Probe Station Connection Kit, enables us to easily connect the Keysight E4991A to a RF probe system from Cascade Microtech for making on-wafer impedance measurements.
Temperature characteristic evaluation
The temperature characteristic test kit, the E4991A-007, is a new solution of temperature characteristic measurement for components and materials. This option provides highly accurate temperature characteristic analysis capability within the wide temperature range from - 55°C to + 150°C with a powerful temperature drift compensation function.
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